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arXiv · 2609.26714

Evidence for a low-gap component in compressively stressed niobium thin films

J. T. Paustian·Maciej Olszewski·Kiichi Okubo·Lingda Kong·B. L. T. Plourde·Ethan G. Arnault·Caleb W. Fink·Valla Fatemi·Ivan V. Pechenezhskiy
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Abstract

We investigate the microwave response of sputtered Nb films as a function of biaxial film stress. Although transport measurements show nearly identical superconducting transition temperatures ($9.0\pm 0.2$K) and residual resistance ratios across the stress series, microwave resonators fabricated from highly compressive films exhibit enhanced temperature-dependent loss and larger frequency shifts. A conventional single-phase Mattis--Bardeen description yields an effective critical temperature of $2.4\pm0.2$K, approximately a factor of four below the value obtained from transport measurements. We show that the data are instead consistent with the presence of an additional low-gap component whose contribution increases with compressive stress. These results show that conventional transport measurements can overlook stress-dependent low-energy excitations that strongly influence microwave performance.

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J. T. Paustian, Maciej Olszewski, Kiichi Okubo, Lingda Kong, B. L. T. Plourde, Ethan G. Arnault, Caleb W. Fink, Valla Fatemi, Ivan V. Pechenezhskiy. 2026-09-22. Evidence for a low-gap component in compressively stressed niobium thin films. https://arxiv.org/abs/2609.26714

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