arXiv subjects

Zian Mao

Publications and source records attributed to Zian Mao.

4 recordsLinked to original sources

arXiv2026

A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns

Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reciprocal-space information but large, heterogeneous data volumes. Here we describe 4D-ImageNet, a collection of 174,000 diffraction patterns comprising 145,000 experimental patterns selected from 29 acquisitions and 29,000 multislice simulations. The experimental data cover acquisition-level labels for Ag, Au, mixed Au-Ag, CoO, Pd and ZnO specimens across multiple fields of view, scan dimensions, camera lengths and exposure times. Each acquisition contributes 5,000 quality-ranked patterns with source scan coordinates and acquisition metadata. A set-prediction detector provides model-derived pseudo-labels for the direct-beam position and Bragg-disk centres, with a confidence score for each disk. The simulation data cover 13 crystal structures and include Euler rotations, reciprocal-space sampling and approximate low-index beam directions. A grouped mixed-domain masked-reconstruction benchmark is provided to assess leakage-resistant loading and evaluation across experimental and simulated data. The dataset is intended for representation learning, disk detection, diffraction-pattern retrieval, orientation analysis and simulation-to-experiment studies.

cs.CV↗

arXiv2026

Multi4D: an end-to-end neural network for structural determination at complex material interfaces

Heterogeneous interfaces dictate the performance and degradation of functional materials, making it essential to link local structural variations with macroscopic failure mechanisms to guide future materials design. Yet structural heterogeneity, phase overlap, and local disorder produce highly convoluted diffraction signatures, making extended transition regions difficult to interpret at atomic resolution across large fields of view. Here, we introduce Multi4D, a physics-informed neural network framework for automated multi-component crystallographic identification using four-dimensional scanning transmission electron microscopy (4D-STEM). By combining a latent-space Diffusion Transformer for physics-constrained style translation with a rotation-invariant convolutional neural network for orientation-agnostic classification, this approach translates multi-components diffraction datasets into deterministic crystallographic maps with 98.82% accuracy. In addition, we introduce Diffraction-Inferred Structural Complexity as an information-theoretic entropy metric derived from classifier predictive uncertainty that quantifies local structural ambiguity. We apply Multi4D to generate high-fidelity structural maps of complex superconducting heterostructures, corroded alloy surfaces, and degraded solid-state battery interfaces down to single-nanometer spatial resolution. This framework establishes a statistically robust analytical paradigm for automated microscopy, facilitating both industrial quality control and the data-driven discovery of interfacial design principles.

cond-mat.mtrl-sci↗

arXiv2025

4D-PreNet: A Unified Preprocessing Framework for 4D-STEM Data Analysis

Automated experimentation with real time data analysis in scanning transmission electron microscopy (STEM) often require end-to-end framework. The four-dimensional scanning transmission electron microscopy (4D-STEM) with high-throughput data acquisition has been constrained by the critical bottleneck results from data preprocessing. Pervasive noise, beam center drift, and elliptical distortions during high-throughput acquisition inevitably corrupt diffraction patterns, systematically biasing quantitative measurements. Yet, conventional correction algorithms are often material-specific and fail to provide a robust, generalizable solution. In this work, we present 4D-PreNet, an end-to-end deep-learning pipeline that integrates attention-enhanced U-Net and ResNet architectures to simultaneously perform denoising, center correction, and elliptical distortion calibration. The network is trained on large, simulated datasets encompassing a wide range of noise levels, drift magnitudes, and distortion types, enabling it to generalize effectively to experimental data acquired under varying conditions. Quantitative evaluations demonstrate that our pipeline reduces mean squared error by up to 50% during denoising and achieves sub-pixel center localization in the center detection task, with average errors below 0.04 pixels. The outputs are bench-marked against traditional algorithms, highlighting improvements in both noise suppression and restoration of diffraction patterns, thereby facilitating high-throughput, reliable 4D-STEM real-time analysis for automated characterization.

cs.CV↗

arXiv2025

4D-MISR: A unified model for low-dose super-resolution imaging via feature fusion

While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like proteins and 2D materials. To overcome this challenge, we push beyond the electron dose limits of conventional electron microscopy by adapting principles from multi-image super-resolution (MISR) that have been widely used in remote sensing. Our method fuses multiple low-resolution, sub-pixel-shifted views and enhances the reconstruction with a convolutional neural network (CNN) that integrates features from synthetic, multi-angle observations. We developed a dual-path, attention-guided network for 4D-STEM that achieves atomic-scale super-resolution from ultra-low-dose data. This provides robust atomic-scale visualization across amorphous, semi-crystalline, and crystalline beam-sensitive specimens. Systematic evaluations on representative materials demonstrate comparable spatial resolution to conventional ptychography under ultra-low-dose conditions. Our work expands the capabilities of 4D-STEM, offering a new and generalizable method for the structural analysis of radiation-vulnerable materials.

cs.CV↗