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arXiv · 2609.21593

A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns

Yuyan Guan·Haoran Zhang·Zian Mao·Antong Yang·Caifei Li·Jialong Wang·Chuying Ouyang·Hong Wang·Xiaoqin Zeng·Yujun Xie
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Abstract

Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reciprocal-space information but large, heterogeneous data volumes. Here we describe 4D-ImageNet, a collection of 174,000 diffraction patterns comprising 145,000 experimental patterns selected from 29 acquisitions and 29,000 multislice simulations. The experimental data cover acquisition-level labels for Ag, Au, mixed Au-Ag, CoO, Pd and ZnO specimens across multiple fields of view, scan dimensions, camera lengths and exposure times. Each acquisition contributes 5,000 quality-ranked patterns with source scan coordinates and acquisition metadata. A set-prediction detector provides model-derived pseudo-labels for the direct-beam position and Bragg-disk centres, with a confidence score for each disk. The simulation data cover 13 crystal structures and include Euler rotations, reciprocal-space sampling and approximate low-index beam directions. A grouped mixed-domain masked-reconstruction benchmark is provided to assess leakage-resistant loading and evaluation across experimental and simulated data. The dataset is intended for representation learning, disk detection, diffraction-pattern retrieval, orientation analysis and simulation-to-experiment studies.

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Yuyan Guan, Haoran Zhang, Zian Mao, Antong Yang, Caifei Li, Jialong Wang, Chuying Ouyang, Hong Wang, Xiaoqin Zeng, Yujun Xie. 2026-09-18. A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns. https://arxiv.org/abs/2609.21593

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