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Jonathan Menard

Publications and source records attributed to Jonathan Menard.

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The FLARE Facility

The Facility for Laboratory Reconnection Experiments (FLARE) has been constructed to study magnetic reconnection in multiple X-line regimes relevant to space, astrophysical, and fusion plasmas. Building upon the successful design of the Magnetic Reconnection Experiment (MRX), FLARE features a larger physical volume, stronger magnetic fields, and an independent ohmic heating drive to significantly extend the accessible parameter space, targeting Lundquist numbers up to S ~ 10^5 and normalized system sizes up to \lambda ~ 10^3. This paper details the facility's core engineering components, including the primary vacuum vessel, internal flux cores, highly segmented external coil systems, modular capacitor banks, and the safety interlock and control architecture. An initial diagnostic suite is presented, comprising high-resolution 2D magnetic probe arrays, triple Langmuir probes, a fully fiber-coupled interferometer, ion Doppler spectroscopy, and fast camera imaging. Initial operations demonstrate the device's experimental flexibility and reliability, successfully executing symmetric push-pull reconnection, spheromak merging, and asymmetric downstream configurations. Currently operating within "Stage 2.5" with S ~ 2,500 and \lambda ~ 60 for anti-parallel reconnection, FLARE provides immediate access to the multiple X-line regimes. Planned hardware upgrades, advanced diagnostic additions, and integration with fully kinetic simulations will further expand its capabilities as it transitions into a collaborative user facility for the broader plasma science community.

physics.plasm-ph

Atomic Precision Processing of New Materials for Frontier Microelectronic Applications in High Performance Computing and Artificial Intelligence

This document is a joint response by scientists from the Princeton Plasma Physics Laboratory, IBM T. J. Watson Research Center and Applied Materials, Inc. to the DOE Office of Science (DOE-SC) Request for Information: Basic Research Initiative for Microelectronics (https://www.federalregister.gov/documents/2019/07/12/2019-14869/request-for-information-basic-research-initiative-for-microelectronics). Specifically, we propose DOE-SC to include the following topics in their consideration for future solicitations on Microelectronics: 1) The development of a real-time monitoring and in-situ diagnostic techniques that can provide information on plasma, substrate surface, and interaction between both during atomic precision processing of complex materials for the most advanced microelectronic devices with applications to high performance computing and artificial intelligence, and 2) The development of experimentally validated modeling tools to predict processing dynamics including plasma, chemical and material processes involved.

physics.app-ph