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arXiv · 2601.23218

In-situ Straining of Epitaxial Freestanding Ferroic Films by a MEMS Device

Simone Finizio·Tim A. Butcher·Maria Cocconcelli·Elisabeth Müller·Lauren J. Riddiford·Jeffrey A. Brock·Chia-Chun Wei·Li-Shu Wang·Jan-Chi Yang·Shih-Wen Huang·Federico Maspero·Riccardo Bertacco·Jörg Raabe
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Abstract

Mechanical strain can be used to control physical properties in materials. The experimental investigation of strain-induced effects at the nanoscale is of importance not only for its fundamental aspects, but also for the development of device applications. Transmission X-ray microscopy is a particularly well-suited technique for nanoscale imaging of magnetic materials, but its compatibility with in-situ mechanical straining of samples is limited. In this work, we present a setup for applying tailored in-situ mechanical strains to freestanding thin films by means of a micro electromechanical system (MEMS) actuator. We then present a proof-of-concept experiment in which a freestanding 80 nm thick (001) BiFeO3 multiferroic thin film is strained with the MEMS device, allowing us to control the coupled ferroelectric/spin cycloidal configuration.

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Simone Finizio, Tim A. Butcher, Maria Cocconcelli, Elisabeth Müller, Lauren J. Riddiford, Jeffrey A. Brock, Chia-Chun Wei, Li-Shu Wang, Jan-Chi Yang, Shih-Wen Huang, Federico Maspero, Riccardo Bertacco, Jörg Raabe. 2026-01-30. In-situ Straining of Epitaxial Freestanding Ferroic Films by a MEMS Device. https://doi.org/10.1103/pj3y-qfvb

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