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arXiv · 2409.14272

Low-Loss Higher-Order Cross-Sectional Lam\'e Mode SAW Devices in 10-20 GHz Range

Ian Anderson·Tzu-Hsuan Hsu·Vakhtang Chulukhadze·Jack Kramer·Sinwoo Cho·Omar A. Barrera·Joshua Campbell·Ming-Huang Li·Ruochen Lu
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Abstract

This paper presents surface acoustic wave (SAW) acoustic delay lines (ADL) for studying propagation loss mechanisms in Lithium Niobate (LN). Devices were fabricated by depositing 50 nm aluminum patterns on 600 nm X-Cut LN on amorphous silicon on silicon carbide, where longitudinally dominant SAW was targeted. Upon fabrication, higher-order thickness-based cross-sectional Lam\'e modes and Rayleigh modes were studied for their Q factors using acoustic delay lines. Utilizing bi-directional electrodes, ADL with lateral lambda values ranging from 0.4 um to 0.6 um were measured. Higher order Lame modes were found to have consistently higher Q factors than their Rayleigh mode counterpart, on the order of 1000-3000, showing high-frequency SAW devices as still viable candidates for frequency scaling without a substantial increase in loss.

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Ian Anderson, Tzu-Hsuan Hsu, Vakhtang Chulukhadze, Jack Kramer, Sinwoo Cho, Omar A. Barrera, Joshua Campbell, Ming-Huang Li, Ruochen Lu. 2024-09-22. Low-Loss Higher-Order Cross-Sectional Lam\'e Mode SAW Devices in 10-20 GHz Range. https://arxiv.org/abs/2409.14272

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