arXiv · 2408.02409
Electron-beam-induced modification of gold microparticles in an SEM
Abstract
Electron-beam-induced conversion of materials in a transmission electron microscope uses the high power density of a localized electron beam of acceleration voltages above 100 kV as an energy source to transform matter at the sub-micron scale. Here, the e-beam-induced transformation of precursor microparticles employing a low-energy e-beam with an acceleration voltage of 30 kV in a scanning electron microscope is developed to increase the versatility and efficiency of the technique. Under these conditions, the technique can be classified between e-beam lithography, where the e-beam is used to mill holes in or grow some different material onto a substrate, and e-beam welding, where matter can be welded together when overcoming the melting phase. Modifying gold microparticles on an amorphous SiOx substrate reveals the dominant role of inelastic electron-matter interaction and subsequent localized heating for the observed melting and vaporization of the precursor microparticles under the electron beam. Monte-Carlo scattering simulations and thermodynamic modeling further support the findings.
Explore related subjects
Keep this discovery
Kristina Weinel, Marc Benjamin Hahn, Axel Lubk, Wen Feng, Ignacio Gonzalez Martinez, Bernd Büchner, Leonardo Agudo Jácome. 2024-08-05. Electron-beam-induced modification of gold microparticles in an SEM. https://arxiv.org/abs/2408.02409
Cite the original work for its findings. Save a collection to share your selection of sources.