Quantitative determination of twist angle and strain in Van der Waals moir\'e superlattices

Steven J. Tran; Jan-Lucas Uslu; Mihir Pendharkar; Joe Finney; Aaron L. Sharpe; Marisa Hocking; Nathan J. Bittner; Kenji Watanabe; Takashi Taniguchi; Marc A. Kastner; Andrew J. Mannix; David Goldhaber-Gordon

arXiv · 2406.08681

Quantitative determination of twist angle and strain in Van der Waals moir\'e superlattices

Steven J. Tran·Jan-Lucas Uslu·Mihir Pendharkar·Joe Finney·Aaron L. Sharpe·Marisa Hocking·Nathan J. Bittner·Kenji Watanabe·Takashi Taniguchi·Marc A. Kastner·Andrew J. Mannix·David Goldhaber-Gordon

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Abstract

Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moir\'es. The high lateral spatial resolution provided by these techniques enables extracting the moir\'e lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos which drive the scanning probe, and thermally-driven slow relative drift between probe and sample, produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001{\deg} and uniaxial heterostrain with uncertainty on the order of 0.002%.

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Steven J. Tran, Jan-Lucas Uslu, Mihir Pendharkar, Joe Finney, Aaron L. Sharpe, Marisa Hocking, Nathan J. Bittner, Kenji Watanabe, Takashi Taniguchi, Marc A. Kastner, Andrew J. Mannix, David Goldhaber-Gordon. 2024-06-12. Quantitative determination of twist angle and strain in Van der Waals moir\'e superlattices. https://arxiv.org/abs/2406.08681

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