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arXiv · 2204.04160

Leverage the Average: Averaged Sampling in Pre-Silicon Side-Channel Leakage Assessment

Pantea Kiaei·Zhenyuan Liu·Patrick Schaumont
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Abstract

Pre-silicon side-channel leakage assessment is a useful tool to identify hardware vulnerabilities at design time, but it requires many high-resolution power traces and increases the power simulation cost of the design. By downsampling and averaging these high-resolution traces, we show that the power simulation cost can be considerably reduced without significant loss of side-channel leakage assessment quality. We introduce a theoretical basis for our claims. Our results demonstrate up to 6.5-fold power-simulation speed improvement on a gate-level side-channel leakage assessment of a RISC-V SoC. Furthermore, we clarify the conditions under which the averaged sampling technique can be successfully used.

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Pantea Kiaei, Zhenyuan Liu, Patrick Schaumont. 2022-04-08. Leverage the Average: Averaged Sampling in Pre-Silicon Side-Channel Leakage Assessment. https://doi.org/10.1145/3526241.3530337

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