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arXiv · 2110.14458

Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy

C. -T. Kuo·G. Conti·J. E. Rault·C. M. Schneider·S. Nemšák·A. X. Gray
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Abstract

Emergent phenomena at complex-oxide interfaces have become a vibrant field of study in the past two decades due to the rich physics and a wide range of possibilities for creating new states of matter and novel functionalities for potential devices. Electronic-structural characterization of such phenomena presents a unique challenge due to the lack of direct yet non-destructive techniques for probing buried layers and interfaces with the required Angstrom-level resolution, as well as element and orbital specificity. In this review article, we survey several recent studies wherein soft x-ray standing-wave photoelectron spectroscopy, a relatively newly developed technique, is used to investigate buried oxide interfaces exhibiting emergent phenomena such as metal-insulator transition, interfacial ferromagnetism, and two-dimensional electron gas. Advantages, challenges, and future applications of this methodology are also discussed.

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C. -T. Kuo, G. Conti, J. E. Rault, C. M. Schneider, S. Nemšák, A. X. Gray. 2021-10-27. Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy. https://doi.org/10.1116/6.0001584

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