Optical Identification of Materials Transformations in Oxide Thin Films

Duncan R. Sutherland; Aine Boyer Connolly; Maximilian Amsler; Ming-Chiang Chang; Katie Rose Gann; Vidit Gupta; Sebastian Ament; Dan Guevarra; John M. Gregoire; Carla P. Gomes; R. B. van Dover; Michael O. Thompson

arXiv · 2008.06419

Optical Identification of Materials Transformations in Oxide Thin Films

Duncan R. Sutherland·Aine Boyer Connolly·Maximilian Amsler·Ming-Chiang Chang·Katie Rose Gann·Vidit Gupta·Sebastian Ament·Dan Guevarra·John M. Gregoire·Carla P. Gomes·R. B. van Dover·Michael O. Thompson

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Abstract

Recent advances in high-throughput experimentation for combinatorial studies have accelerated the discovery and analysis of materials across a wide range of compositions and synthesis conditions. However, many of the more powerful characterization methods are limited by speed, cost, availability, and/or resolution. To make efficient use of these methods, there is value in developing approaches for identifying critical compositions and conditions to be used as a-priori knowledge for follow-up characterization with high-precision techniques, such as micron-scale synchrotron based X-ray diffraction (XRD). Here we demonstrate the use of optical microscopy and reflectance spectroscopy to identify likely phase-change boundaries in thin film libraries. These methods are used to delineate possible metastable phase boundaries following lateral-gradient Laser Spike Annealing (lg-LSA) of oxide materials. The set of boundaries are then compared with definitive determinations of structural transformations obtained using high-resolution XRD. We demonstrate that the optical methods detect more than 95% of the structural transformations in a composition-gradient La-Mn-O library and a Ga$_2$O$_3$ sample, both subject to an extensive set of lg-LSA anneals. Our results provide quantitative support for the value of optically-detected transformations as a priori data to guide subsequent structural characterization, ultimately accelerating and enhancing the efficient implementation of $\mu$m-resolution XRD experiments.

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Duncan R. Sutherland, Aine Boyer Connolly, Maximilian Amsler, Ming-Chiang Chang, Katie Rose Gann, Vidit Gupta, Sebastian Ament, Dan Guevarra, John M. Gregoire, Carla P. Gomes, R. B. van Dover, Michael O. Thompson. 2020-08-14. Optical Identification of Materials Transformations in Oxide Thin Films. https://arxiv.org/abs/2008.06419

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