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X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal

Fabien Cheynis·Nicolas Rougemaille·Rachid Belkhou·Jean-Christophe Toussaint·Olivier Fruchart
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Abstract

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120 mT, with a $\pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.

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Fabien Cheynis, Nicolas Rougemaille, Rachid Belkhou, Jean-Christophe Toussaint, Olivier Fruchart. 2008-02-06. X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal. https://doi.org/10.1063/1.2832332

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