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The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

Z. Suszynski·M. Kosikowski·R. Duer
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Abstract

In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.

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Z. Suszynski, M. Kosikowski, R. Duer. 2007-09-12. The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure. https://arxiv.org/abs/0709.1866

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