TY  - RPRT
TI  - Analytical framework for interpreting thermoreflectance measurements of nanoline gratings under finite spot illumination
AU  - Abhishek Pathak
AU  - Seungwon Park
AU  - Shubham Deshmukh
AU  - Alan J. H. McGaughey
AU  - Jonathan A. Malen
PY  - 2026
UR  - https://arxiv.org/abs/2610.37957
ID  - 2610.37957
ER  -