TY  - RPRT
TI  - Enhancing Bug-Exposing Test Generation via Step-Level Credit Assignment and Self-Distillation from Valuable Failures
AU  - Wenjie Gan
AU  - Zhaoxi Zhang
AU  - Jiahui Liang
AU  - Weikang Li
AU  - Wanyuan Wang
AU  - Li Zhang
AU  - Jian Dong
PY  - 2026
UR  - https://arxiv.org/abs/2610.27694
ID  - 2610.27694
ER  -