TY  - RPRT
TI  - Grain-Size Dependence of Thermal and Electrical Properties in (Cr,Mo,Ta,V,W)C1-δ High-Entropy Carbide Ceramics
AU  - Ali Sarikhani
AU  - Gregory E. Hilmas
AU  - David W. Lipke
AU  - Douglas E. Wolfe
AU  - Stefano Curtarolo
AU  - Shen J. Dillon
AU  - William G. Fahrenholtz
PY  - 2026
DO  - 10.1111/jace.71312
UR  - https://arxiv.org/abs/2610.20864
ID  - 2610.20864
ER  -