TY  - RPRT
TI  - Growth-induced trade-off between polarity, electrical isolation, and structural quality in AlN grown on Si(111) by plasma-assisted molecular beam epitaxy
AU  - Hossein Yazdani
AU  - Nhu Tran
AU  - Xin Du
AU  - Vit Hornik
AU  - Roman Gröger
AU  - YongJin Cho
PY  - 2026
UR  - https://arxiv.org/abs/2610.20523
ID  - 2610.20523
ER  -