TY  - RPRT
TI  - Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)
AU  - Hyeonhee Na
AU  - Jeonghwan Oh
AU  - Jinju Lee
AU  - Hanjun Sim
AU  - Myeongun Go
AU  - Jimin Sohn
AU  - Jeonggu Kang
AU  - Byungmin Sohn
PY  - 2026
UR  - https://arxiv.org/abs/2610.16421
ID  - 2610.16421
ER  -