@misc{indiciaea02f26c1a2f3,
  title = {Assessing quantitative phase reliability in electron ptychography using a twisted trilayer WS2 thickness staircase},
  author = {Hu Bao and Qilong Feng and Kun Ye and Tianyu Xue and Stephen J. Pennycook and Yihan Zhu and Anmin Nie and Shoucong Ning and Jing Tao},
  year = {2026},
  url = {https://arxiv.org/abs/2610.13115},
  note = {Source identifier: 2610.13115}
}