@misc{indiciae49eb21ad2f61,
  title = {Electromagnetic Side-Channel Vulnerability in QKD Equipment},
  author = {Mikio Fujiwara and Katsumi Fujii and Fumie Ono and Masakazu Ono and Akihisa Tomita},
  year = {2026},
  doi = {10.1109/access.2026.3737227},
  url = {https://arxiv.org/abs/2610.01609},
  note = {Source identifier: 2610.01609}
}