@misc{indiciaecd5226e11827,
  title = {Syndrome measurements enable deterministic fault-tolerant \$T\$ gates},
  author = {Kishor Bharti and Tobias Haug and Andrew Tanggara},
  year = {2026},
  url = {https://arxiv.org/abs/2609.29890},
  note = {Source identifier: 2609.29890}
}