TY  - RPRT
TI  - One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories
AU  - Christian Acal
AU  - Juan Eloy Ruiz-Castro
AU  - David Maldonado
AU  - Juan B. Roldán
PY  - 2025
DO  - 10.3390/math9212734
UR  - https://arxiv.org/abs/2501.07949
ID  - 2501.07949
ER  -