TY  - RPRT
TI  - The Hot-Spot Phenomenon and its Countermeasures in Bipolar Power Transistors by Analytical Electro-Thermal Simulation
AU  - F. Stefani
AU  - P. -E. Bagnoli
PY  - 2007
UR  - https://arxiv.org/abs/0709.1831
ID  - 0709.1831
ER  -