Twist and strain identification in moir\'e heterostructures
The geometrical and electronic properties of moir\'e materials are highly sensitive to the twist and strain in the samples due to the moir\'e magnifying effect. Accurate identification of twist and strain in moir\'e materials is therefore essential. In this work, we establish a general framework to extract the twist and strain configurations from moir\'e images with either atomic or moir\'e scale resolution. With only moir\'e-wavelength information, we show that there is a continuous family of possible twist and strain configurations, each one accounting for different orientations of the moir\'e pattern. To estimate the most likely twist-strain configuration, we discuss additional constraints and methods involving the minimum elastic energy and the electronic spectra. The minimum elastic energy, in particular, reflects that shear configurations become much more favorable as the strain increases. As an example of the developed methodology, we discuss the formation and identification of strained triangular moir\'e patterns. Our framework provides a comprehensive approach to identify the twist and strain configurations in systems with moir\'e-scale resolution.