arXiv subjects

Xue-Feng Yu

Publications and source records attributed to Xue-Feng Yu.

5 recordsLinked to original sources

arXiv2026

A collaborative agent with two lightweight synergistic models for autonomous crystal materials research

Current large language models require hundreds of billions of parameters yet struggle with domain-specific reasoning and tool coordination in materials science. Here, we present MatBrain, a lightweight collaborative agent system with two synergistic models specialization for crystal materials research. MatBrain employs a dual-model architecture: Mat-R1 (30B parameters) as the analytical model providing expert-level domain reasoning, and Mat-T1 (14B parameters) as the executive model orchestrating tool-based actions. Entropy analysis confirms that this architecture resolves the conflict between tool planning and analytical reasoning by decoupling their distinct entropy dynamics. Enabled by this dual-model architecture and structural efficiency, MatBrain significantly outperforms larger general-purpose models while reducing the hardware deployment barrier by over 95%. MatBrain exhibits versatility across structure generation, property prediction, and synthesis planning tasks. Applied to catalyst design, MatBrain generated 30,000 candidate structures and identified 38 promising materials within 48 hours, achieving approximately 100-fold acceleration over traditional approaches. These results demonstrate the potential of lightweight collaborative intelligence for advancing materials research capabilities.

cs.AI↗

arXiv2024

Quantitatively predicting angle-resolved polarized Raman intensity of anisotropic layered materials

Angle-resolved polarized Raman (ARPR) spectroscopy provides insights into optical anisotropy and symmetry-related electron-photon/electron-phonon couplings of anisotropic layered materials (ALMs). However, since their discovery over ten years ago, ARPR responses in ALM flakes has exhibited a puzzling dependence on flake thickness, excitation wavelength, and dielectric environment, complicating their understanding and prediction. By taking black phosphorus (BP) (large than 20 nm) flakes and four-layer Td-WTe2 as examples, this study introduces intrinsic Raman tensors (Rint) and proposes strategies to predict the ARPR intensity profiles of thick and atomically-thin ALM flakes by considering birefringence, linear dichroism and multilayer interference inside multilayered structures with experimentally determined complex refractive indexes along in-plane axes and complex tensor elements of Rint for the corresponding phonon modes. The tensor elements of effective Raman tensors (Reff), which are directly linked to the polarization vectors of incident and scattered light outside the ALM surface, were derived to quantitatively predict ARPR intensity for these ALM flakes, showing intricate dependence on ALM thickness, dielectric substrates, and excitation wavelengths. This framework can be extended to other ALM flakes from atomically-thin layers to bulk limit, facilitating comprehensive prediction of their ARPR intensity regardless of layer-dependent electronic properties.

cond-mat.mes-hall↗

arXiv2022

CMOS based high-resolution dynamic X-ray imaging with inorganic perovskite

High-resolution dynamic X-ray detector is crucial for time-resolved digital radiography (DR) imaging and fast 3D medical computed tomography (CT) imaging. Recently, perovskites have become promising alternatives to conventional semi-conductor materials, e.g., Si, a-Se and CdTe, for direct X-ray detection. However, the feasibility of their combination with high-speed pixelated complementary metal-oxide-semiconductor (CMOS) arrays remains unknown. This work originally reports an innovative direct-conversion X-ray detector fabricated with 300 micrometer thick inorganic perovskite film printed on a tailored CMOS array. In-house measurements demonstrate that the CsPbBr3 film has excellent optoelectric properties of an electron mobility-lifetime product of 3.40x10$^{-5}$ cm$^2$ V$^{-1}$, and the X-ray detector exhibits high sensitivity of 9341uC Gy$_{\rm air}^{-1}$ cm$^{-2}$, and low detection limit of 588 nGy$_{\rm air}^{-1}$. This CMOS X-ray imaging detector achieves a high spatial resolution up to 5.5 lp/mm (close to the resolution limit of 6.0 lp/mm), and >300 frame per second (fps) readout speed. DR image of a resolution pattern phantom and a anesthesia mice, CT images of a biological specimen are acquired for the first time.

physics.app-ph↗

arXiv2020

Understanding angle-resolved polarized Raman scattering from black phosphorus at normal and oblique laser incidences

The selection rule for angle-resolved polarized Raman (ARPR) intensity of phonons from standard group-theoretical method in isotropic materials would break down in anisotropic layered materials (ALMs) due to birefringence and linear dichroism effects. The two effects result in depth-dependent polarization and intensity of incident laser and scattered signal inside ALMs and thus make a challenge to predict ARPR intensity at any laser incidence direction. Herein, taking in-plane anisotropic black phosphorus as a prototype, we developed a so-called birefringence-linear-dichroism (BLD) model to quantitatively understand its ARPR intensity at both normal and oblique laser incidences by the same set of real Raman tensors for certain laser excitation. No fitting parameter is needed, once the birefringence and linear dichroism effects are considered with the complex refractive indexes. An approach was proposed to experimentally determine real Raman tensor and complex refractive indexes, respectively, from the relative Raman intensity along its principle axes and incident-angle resolved reflectivity by Fresnel$'$s law. The results suggest that the previously reported ARPR intensity of ultrathin ALM flakes deposited on a multilayered substrate at normal laser incidence can be also understood based on the BLD model by considering the depth-dependent polarization and intensity of incident laser and scattered Raman signal induced by both birefringence and linear dichroism effects within ALM flakes and the interference effects in the multilayered structures, which are dependent on the excitation wavelength, thickness of ALM flakes and dielectric layers of the substrate. This work can be generally applicable to any opaque anisotropic crystals, offering a promising route to predict and manipulate the polarized behaviors of related phonons.

cond-mat.mtrl-sci↗

arXiv2015

Microfiber-based few-layer black phosphorus saturable absorber for ultra-fast fiber laser

Few-layer black phosphorus (BP), as the most alluring graphene analogue owing to its similar structure as graphene and thickness dependent direct band-gap, has now triggered a new wave of research on two-dimensional (2D) materials based photonics and optoelectronics. However, a major obstacle of practical applications for few-layer BPs comes from their instabilities of laser-induced optical damage. Herein, we demonstrate that, few-layer BPs, fabricated through the liquid exfoliation approach, can be developed as a new and practical saturable absorber (SA) by depositing few-layer BPs with microfiber. The saturable absorption property of few-layer BPs had been verified through an open-aperture z-scan measurement at the telecommunication band and the microfiber-based BP device had been found to show a saturable average power of ~4.5 mW and a modulation depth of 10.9%, which is further confirmed through a balanced twin detection measurement. By further integrating this optical SA device into an erbium-doped fiber laser, it was found that it can deliver the mode-locked pulse with duration down to 940 fs with central wavelength tunable from 1532 nm to 1570 nm. The prevention of BP from oxidation through the 'lateral interaction scheme' owing to this microfiber-based few-layer BP SA device might partially mitigate the optical damage problem of BP. Our results not only demonstrate that black phosphorus might be another promising SA material for ultrafast photonics, but also provide a practical solution to solve the optical damage problem of black phosphorus by assembling with waveguide structures such as microfiber.

physics.optics↗