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Tom Oomen

Publications and source records attributed to Tom Oomen.

74 records · Page 5Linked to original sources
arXiv2019

Multivariable Iterative Learning Control Design Procedures: from Decentralized to Centralized, Illustrated on an Industrial Printer

Iterative Learning Control (ILC) enables high control performance through learning from measured data, using only limited model knowledge in the form of a nominal parametric model. Robust stability requires robustness to modeling errors, often due to deliberate undermodeling. The aim of this paper is to develop a range of approaches for multivariable ILC, where specific attention is given to addressing interaction. The proposed methods either address the interaction in the nominal model, or as uncertainty, i.e., through robust stability. The result is a range of techniques, including the use of the structured singular value (SSV) and Gershgorin bounds, that provide a different trade-off between modeling requirements, i.e., modeling effort and cost, and achievable performance. This allows control engineers to select the approach that fits the modeling budget and control requirements. This trade-off is demonstrated in a case study on an industrial flatbed printer.

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arXiv2017

Sparse Iterative Learning Control with Application to a Wafer Stage: Achieving Performance, Resource Efficiency, and Task Flexibility

Trial-varying disturbances are a key concern in Iterative Learning Control (ILC) and may lead to inefficient and expensive implementations and severe performance deterioration. The aim of this paper is to develop a general framework for optimization-based ILC that allows for enforcing additional structure, including sparsity. The proposed method enforces sparsity in a generalized setting through convex relaxations using $\ell_1$ norms. The proposed ILC framework is applied to the optimization of sampling sequences for resource efficient implementation, trial-varying disturbance attenuation, and basis function selection. The framework has a large potential in control applications such as mechatronics, as is confirmed through an application on a wafer stage.

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