X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films
X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain $β$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration with the $β$-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe$_7$Se$_8$ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the $β$-FeSe phase are shown.
cond-mat.mtrl-sci↗