arXiv subjects

Sean Oliver

Publications and source records attributed to Sean Oliver.

3 recordsLinked to original sources

arXiv2026

Beyond sensitivity: mechanism-resolved error budgets for designing quantum sensors

Quantum sensors are specified by a headline sensitivity, yet applications also demand accuracy and reliability. The dominant limiter of one metric is often known, but no method resolves how interacting mechanisms combine into a signed, per-mechanism budget for each metric. We introduce a framework that computes a sensor's sensitivity, accuracy, and robustness from one open-system simulation and attributes each to its limiting mechanism. For a nitrogen-vacancy diamond ensemble the attribution inverts across metrics: dephasing limits sensitivity, the thermal ground-state shift limits accuracy, and optical leakage limits robustness. At identical sensitivity the recovered-field bias spans $8$ to $1500$\,nT, so tuning to sensitivity alone can miss the accuracy target by two orders of magnitude. The same modeling transfers to a cesium optically pumped magnetometer recording a human magnetocardiogram. As a digital twin, it predicts the gain from addressing each limiter, so sensors can be designed to the required metrics.

quant-ph↗

arXiv2024

Two Dimensional Magnetic Current Imaging Via L1-Curl Regularized Divergence Free Wavelet Reconstruction

The reconstruction of current distributions from samples of their induced magnetic field is a challenging problem due to multiple factors. First, the problem of reconstructing general three dimensional current distributions is ill-posed. Second, the current-to-field operator performs a low-pass filter that dampens high-spatial frequency information, so that even in situations where the inversion is formally possible, attempting to employ the formal inverse will result in solutions with unacceptable noise. Most contemporary methods for reconstructing current distributions in two dimensions are based on Fourier techniques and apply a low pass filter to the $B$-field data, which prevents excessive noise amplification during reconstruction at the cost of admitting blurring in the reconstructed solution. In this report, we present a method of current recovery based on penalizing the $L1$ norm of the curl of the current distribution. The utility of this method is based on the observation that in microelectronics settings, the conductivity is piecewise constant. We also reconstruct the current fields using a divergence-free wavelet basis. This has the advantage of automatically enforcing current continuity and halving the number of unknowns that must be solved for. Additionally, the curl operator can be computed exactly and analytically in this wavelet expansion, which simplifies the application of the $L1-\textrm{curl}$ regularizer. We demonstrate improved reconstruction quality relative to Fourier-based techniques on both simulated and laboratory-acquired magnetic field data.

eess.IV↗

arXiv2024

Bounds on Distinguishing Separated Wires Using Magnetic Field Measurements

Magnetic current imaging (MCI) is useful for non-destructive characterization of microelectronics, including both security analysis and failure analysis, because magnetic fields penetrate the materials that comprise these components to enable through-package imaging of chip activity. Of particular interest are new capabilities offered by emerging magnetic field imagers, such as the Quantum Diamond Microscope, which provide simultaneous wide field-of-view, high spatial resolution vector magnetic field imaging capabilities under ambient conditions. While MCI offers several advantages for non-destructive measurement of microelectronics functional activity, there are many limitations of the technique due to rapid falloff of magnetic fields and loss of high frequency spatial information at large sensor standoff distances. To understand spatial resolution as a function of standoff distance, we consider the problem of using magnetic fields to distinguish (1) between a single wire carrying current $I$ and a pair of wires carrying current $I/2$ in the same direction and (2) between no currents and a pair of wires carrying current $I/2$ in opposite directions. In both cases, we compare performance for a single point measurement, representative of typical magnetometers, to performance for an array of measurements found in emerging magnetic imaging devices. Additionally, we examine the advantage provided by measurement of the full vector magnetic field compared to measurement of a single component. We establish and compare for the first time the theoretical lower bounds on separability based on the wire separation and sensor standoff distance of the magnetic field measurements obtained from traditional and new microelectronics reliability tools.

physics.ins-det↗