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Sandip Halder

Publications and source records attributed to Sandip Halder.

At least 19 recordsLinked to original sources
arXiv2026

Information-Theoretic Causal Modelling of Semiconductor Process Dynamics

With the progress of the semiconductor industry toward increasingly complex compute devices and tighter process tolerances, advanced process control has become crucial. This work explores a novel framework to infer the underlying dynamics of semiconductor processes, directly from raw equipment log-file time-series data. By modelling the tool dynamics as a stochastic dynamical system comprising (a) a deterministic component and (b) a stochastic component, we estimate entropy transfer rates between variables through the Liang-Kleeman and Pires formalism. Preliminary results indicated that 7.5% of the inferred dependencies were known, 36.0% were plausible, 17.5% represented previously uncharacterised relationships, and 39.0% were inconsistent with established process knowledge. These findings demonstrate the framework's capability to uncover novel causal insights, while motivating further improvements to reduce inconsistent findings.

eess.SP↗
arXiv2026

Magnetotransport and Phase competition in three-dimensional Hubbard-Holstein model at half-filling

We investigate the magnetotransport properties of the one-band Hubbard-Holstein model at half-filling in three dimensions (3D) using exact diagonalization based semi-classical Monte Carlo simulations with phonons treated in the adiabatic limit. The low-temperature electronic correlation $U$ vs electron-phonon coupling $V$ phase diagram reveals two insulating phases--antiferromagnetic (AF-I) and charge-ordered (CO-I)--separated by a first-order transition, with no metallic phase observed at their intersection, indicating robustness of these phases in 3D. For $U \sim bandwidth$, the $V$ vs temperature $T$ phase diagram exhibits multiple phases including AF-I, CO-I, Mott-Hubbard insulator, bipolaronic insulator, and two bipolaronic metallic states. Several first-order transitions occur near $V \sim 3.75$. Above the ordering temperature, the density of states shows universal behavior dominated by electronic contribution, while susceptibility and DOS analyses reveal pseudogap features. Magnetic and transport properties along the phase boundary highlight strong proximity effects between competing phases, suggesting routes for tuning correlated materials and emergent electronic states.

cond-mat.str-el↗
arXiv2025

Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series

Semiconductor manufacturing is an extremely complex and precision-driven process, characterized by thousands of interdependent parameters collected across diverse tools and process steps. Multi-variate time-series analysis has emerged as a critical field for real-time monitoring and fault detection in such environments. However, anomaly prediction in semiconductor fabrication presents several critical challenges, including high dimensionality of sensor data and severe class imbalance due to the rarity of true faults. Furthermore, the complex interdependencies between variables complicate both anomaly prediction and root-cause-analysis. This paper proposes two novel approaches to advance the field from anomaly detection to anomaly prediction, an essential step toward enabling real-time process correction and proactive fault prevention. The proposed anomaly prediction framework contains two main stages: (a) training a forecasting model on a dataset assumed to contain no anomalies, and (b) performing forecast on unseen time series data. The forecast is compared with the forecast of the trained signal. Deviations beyond a predefined threshold are flagged as anomalies. The two approaches differ in the forecasting model employed. The first assumes independence between variables by utilizing the N-BEATS model for univariate time series forecasting. The second lifts this assumption by utilizing a Graph Neural Network (GNN) to capture inter-variable relationships. Both models demonstrate strong forecasting performance up to a horizon of 20 time points and maintain stable anomaly prediction up to 50 time points. The GNN consistently outperforms the N-BEATS model while requiring significantly fewer trainable parameters and lower computational cost. These results position the GNN as promising solution for online anomaly forecasting to be deployed in manufacturing environments.

cs.LG↗
arXiv2025

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series

Semiconductor manufacturing is an extremely complex process, characterized by thousands of interdependent parameters collected across diverse tools and process steps. Multi-variate time-series (MTS) analysis has emerged as a critical methodology for enabling real-time monitoring, fault detection, and predictive maintenance in such environments. However, anomaly prediction in semiconductor fabrication presents several critical challenges, including high data dimensionality, severe class imbalance due to the rarity of true faults, noisy and missing measurements, and non-stationary behavior of production systems. Furthermore, the complex interdependencies between variables and the delayed emergence of faults across downstream stages complicate both anomaly detection and root-cause-analysis. This paper presents a novel and generic approach for anomaly detection in MTS data using machine learning. The proposed methodology consists of three main steps: a) converting MTS data into image-based representations using the Continuous Wavelet Transform, b) developing a multi-class image classifier by fine-tuning a pretrained VGG-16 architecture on custom CWT image datasets, and c) constructing a Siamese network composed of two identical sub-networks, each utilizing the fine-tuned VGG-16 as a backbone. The network takes pairs of CWT images as input -one serving as a reference or anchor (representing a known-good signal), and the other as a query (representing an unknown signal). The model then compares the embeddings of both inputs to determine whether they belong to the same class at a given time step. Our approach demonstrates high accuracy in identifying anomalies on a real FAB process time-series dataset, offering a promising solution for offline anomaly detection in process and tool trace data. Moreover, the approach is flexible and can be applied in both supervised and semi-supervised settings.

cs.LG↗
arXiv2025

Exploring the magnetic states in the one-band Hubbard model: Impact of long-range hoppings

Correlated electron systems with competing interactions provide a valuable platform for examining exotic magnetic phases. Theoretical models often focus on nearest-neighbor interactions, although long-range interactions can have a considerable impact on the behavior of the system, creating distinct and complicated magnetic phases. We investigate the consequences of competing interactions in a half-filled one-band Hubbard model on a simple cubic lattice, incorporating hopping processes up to third-nearest-neighbors, to explore the underlying magnetotransport properties. Our magnetic phase diagrams at low temperatures, obtained using semi-classical Monte Carlo analysis, reveal that the long-range interactions can disrupt one form of magnetic phase while creating a new type of magnetic order. For the nonperturbative regime (on-site Hubbard repulsive strength $U \sim$ bandwidth) the C-type antiferromagnetic ground state is preferred over the G-type antiferromagnetic phase when the interaction between second-nearest neighbor sites becomes significant to the nearest-neighbor interactions. However, interactions beyond the second-nearest-neighbors are required to stabilize the A-type antiferromagnetic ground state. Remarkably, at low temperatures, a highly correlated paramagnetic insulating phase develops at the intersection between the antiferromagnetic phases, which might promote a three-dimensional spin-liquid state.

cond-mat.str-el↗
arXiv2024

Microscopic study of interlayer magnetic coupling across the interface in antiferromagnetic bilayers

The enhancement of Neel temperature ($T_N$) of low-$T_{N}$ antiferromagnets in antiferromagnetic bilayers AF1/AF2, where the $T_N$ of AF1 is larger than AF2 (for example enhancement of $T_{N}$ of CoO in CoO/NiO or FeO in FeO/CoO), is a subject of considerable interest. One essential question needs to be answered in these bilayers: is the interfacial coupling a short-range one or long-range that mediates the effect of the AF1 layers on the magnetic properties of AF2 layer? To understand the systematics of the magnetic coupling across the interface, we investigate the plane-resolved magnetotransport properties of antiferromagnetic bilayers using an electron-hole symmetric one-band Hubbard model at half-filling, employing a semi-classical Monte Carlo method. In our model Hamiltonian calculations, we set Coulomb repulsion $U_{1} = 8$ to mimic high-$T_{N}$ AF1 layer, whereas we use $U_{2}$ = $2\times U_{1}$ to mimic the low-$T_{N}$ AF2 layer. Our calculations show that the $T_{N}$ of the low-$T_{N}$ antiferromagnet enhances substantially when it's thickness is small, similar to experiments, giving rise to single magnetic transition temperature of the bilayer system. These findings are well supported by a single peak in temperature-dependent specific heat. However, for larger thicknesses, the $T_{N}$ of the low-$T_{N}$ antiferromagnet approaches towards its bulk value and constituent antiferromagnetic layers align antiferromagnetically at two separate temperatures and two maxima are observed in specific heat data. Our calculations also show that the delocalization of moments is more or less confined near the interface indicating the short-ranged nature of the proximity effect. Our obtained results are consistent with the experimental observations. A detailed discussion of the modifications that will occur if we use $U_{1} = 8$ and $U_{2}$ = $0.5\times U_{1}$ will also be addressed.

cond-mat.str-el↗
arXiv2024

Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes

In this research, we introduce a unified end-to-end Automated Defect Classification-Detection-Segmentation (ADCDS) framework for classifying, detecting, and segmenting multiple instances of semiconductor defects for advanced nodes. This framework consists of two modules: (a) a defect detection module, followed by (b) a defect segmentation module. The defect detection module employs Deformable DETR to aid in the classification and detection of nano-scale defects, while the segmentation module utilizes BoxSnake. BoxSnake facilitates box-supervised instance segmentation of nano-scale defects, supported by the former module. This simplifies the process by eliminating the laborious requirement for ground-truth pixel-wise mask annotation by human experts, which is typically associated with training conventional segmentation models. We have evaluated the performance of our ADCDS framework using two distinct process datasets from real wafers, as ADI and AEI, specifically focusing on Line-space patterns. We have demonstrated the applicability and significance of our proposed methodology, particularly in the nano-scale segmentation and generation of binary defect masks, using the challenging ADI SEM dataset where ground-truth pixelwise segmentation annotations were unavailable. Furthermore, we have presented a comparative analysis of our proposed framework against previous approaches to demonstrate its effectiveness. Our proposed framework achieved an overall mAP@IoU0.5 of 72.19 for detection and 78.86 for segmentation on the ADI dataset. Similarly, for the AEI dataset, these metrics were 90.38 for detection and 95.48 for segmentation. Thus, our proposed framework effectively fulfils the requirements of advanced defect analysis while addressing significant constraints.

cs.CV↗
arXiv2024

An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects. However, semiconductor manufacturing processes are continually evolving, leading to the emergence of new types of defects over time. This presents a significant challenge for conventional supervised defect detectors, as they may suffer from catastrophic forgetting when trained on new defect datasets, potentially compromising performance on previously learned tasks. An alternative approach involves the constant storage of previously trained datasets alongside pre-trained model versions, which can be utilized for (re-)training from scratch or fine-tuning whenever encountering a new defect dataset. However, adhering to such a storage template is impractical in terms of size, particularly when considering High-Volume Manufacturing (HVM). Additionally, semiconductor defect datasets, especially those encompassing stochastic defects, are often limited and expensive to obtain, thus lacking sufficient representation of the entire universal set of defectivity. This work introduces a task-agnostic, meta-learning approach aimed at addressing this challenge, which enables the incremental addition of new defect classes and scales to create a more robust and generalized model for semiconductor defect inspection. We have benchmarked our approach using real resist-wafer SEM (Scanning Electron Microscopy) datasets for two process steps, ADI and AEI, demonstrating its superior performance compared to conventional supervised training methods.

cs.CV↗
arXiv2024

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

cs.CV↗
arXiv2024

Layer Resolved Magnetotransport Properties in Antiferromagnetic/Paramagnetic Superlattices

We investigate the layer resolved magnetotransport properties of the antiferromagnetic/paramagnetic superlattices based on one band half-filled Hubbard model in three dimensions. In our set up the correlated layers (with on-site repulsion strength $U \ne$ 0) are intercalated between the uncorrelated (U = 0) layers. Our calculations based on the semi-classical Monte-Carlo technique show that the magnetic moments are induced in the uncorrelated layers at low temperatures due to kinetic hopping of the carriers across the interface. The average induced magnetic moment in the uncorrelated layer varies nonmonotonically with the $U$ values of the correlated layer. Interestingly, the induced magnetic moments are antiferromagnetically arranged in uncorrelated layers and mediates the antiferromagnetic ordering between correlated layers. As a result the whole SL system turns out to be antiferromagnetic insulating at low temperatures. For $U \sim$ bandwidth the local moments in the correlated planes increases as a function of the distance from the interface. Expectedly our in-plane resistivity calculations show that the metal insulator transition temperature of the central plane is larger than the edge planes in the correlated layers. On the other hand, although the induced moments in uncorrelated planes decreases considerably as move from edge planes to center planes the metal insulator transition temperature remains more or less same for all planes. The induced moments in uncorrelated layers gradually dissipates with increasing the thickness of uncorrelated layer and as a result the long range antiferromagnetic ordering vanishes in the superlattices similar to the experiments.

cond-mat.str-el↗
arXiv2024

Magnetotransport Properties of Ferromagnetic/Antiferromagnetic Superlattices: Probing the role of induced magnetization in antiferromagnetic layer

We investigate the magnetic and transport properties of the $La_{1-x}Sr_{x}MnO_{3}$ (LSMO)/$Pr_{1-x}Ca_{x}MnO_{3}$ (PCMO) like ferromagnetic/antiferromagnetic superlattices in three dimensions using a two orbitals double exchange model incorporating the Jahn-Teller lattice distortions, superexchange interactions and long-range Coulomb interactions. In our simulations we primarily focus on periodic arrangement of $w_L$ planes of ferromagnetic LSMO and $w_P$ planes of antiferromagnetic PCMO manganites, and set $w_L$+$w_P$ = 10. The induced ferromagnetic correlations in the parent PCMO layer decreases monotonically with increasing the PCMO layer width $w_P$ at high temperatures for both half-doping ($n =0.5$) and off-half-doping ($n = 0.55$) scenarios. As we decrease the temperature further the induced ferromagnetic moments in PCMO layer disappears or decreases considerably at half-doping due to the onset of charge ordering in antiferromagnetic PCMO layers. Overall, the magnetization in PCMO layer decreases at low temperatures and the metal-insulator transition temperature of the LSMO/PCMO superlattices increases with increase of the PCMO layer width $w_P$, similar to the experiments. On the other hand, at off-half-doping, the induced ferromagnetic moment survives even at low temperatures due to weakened charge ordering in PCMO layer and interestingly, varies nonmonotonically with PCMO layer width, in agreement with experiments. The nonmonotonic trend of the conductivity of the superlattice with increase of the PCMO layer width $w_P$ shows an one-to-one correspondence between conductivity of the superlattice and the induced ferromagnetic moments in the PCMO layer. We highlight the key role of induced ferromagnetic moment in PCMO layer in analyzing the magnetotransport properties of the LSMO/PCMO superlattices.

cond-mat.str-el↗
arXiv2024

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS

Due to potential pitch reduction, the semiconductor industry is adopting High-NA EUVL technology. However, its low depth of focus presents challenges for High Volume Manufacturing. To address this, suppliers are exploring thinner photoresists and new underlayers/hardmasks. These may suffer from poor SNR, complicating defect detection. Vision-based ML algorithms offer a promising solution for semiconductor defect inspection. However, developing a robust ML model across various image resolutions without explicit training remains a challenge for nano-scale defect inspection. This research's goal is to propose a scale-invariant ADCD framework capable to upscale images, addressing this issue. We propose an improvised ADCD framework as SEMI-SuperYOLO-NAS, which builds upon the baseline YOLO-NAS architecture. This framework integrates a SR assisted branch to aid in learning HR features by the defect detection backbone, particularly for detecting nano-scale defect instances from LR images. Additionally, the SR-assisted branch can recursively generate upscaled images from their corresponding downscaled counterparts, enabling defect detection inference across various image resolutions without requiring explicit training. Moreover, we investigate improved data augmentation strategy aimed at generating diverse and realistic training datasets to enhance model performance. We have evaluated our proposed approach using two original FAB datasets obtained from two distinct processes and captured using two different imaging tools. Finally, we demonstrate zero-shot inference for our model on a new, originating from a process condition distinct from the training dataset and possessing different Pitch characteristics. Experimental validation demonstrates that our proposed ADCD framework aids in increasing the throughput of imaging tools for defect inspection by reducing the required image pixel resolutions.

cs.CV↗
arXiv2023

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance

Moore Law states that transistor density will double every two years, which is sustained until today due to continuous multi-directional innovations, such as extreme ultraviolet lithography, novel patterning techniques etc., leading the semiconductor industry towards 3nm node and beyond. For any patterning scheme, the most important metric to evaluate the quality of printed patterns is EPE, with overlay being its largest contribution. Overlay errors can lead to fatal failures of IC devices such as short circuits or broken connections in terms of P2P electrical contacts. Therefore, it is essential to develop effective overlay analysis and control techniques to ensure good functionality of fabricated semiconductor devices. In this work we have used an imec N14 BEOL process flow using LELE patterning technique to print metal layers with minimum pitch of 48nm with 193i lithography. FF structures are decomposed into two mask layers (M1A and M1B) and then the LELE flow is carried out to make the final patterns. Since a single M1 layer is decomposed into two masks, control of overlay between the two masks is critical. The goal of this work is of two-fold as, (a) to quantify the impact of overlay on capacitance and (b) to see if we can predict the final capacitance measurements with selected machine learning models at an early stage. To do so, scatterometry spectra are collected on these electrical test structures at (a)post litho, (b)post TiN hardmask etch, and (c)post Cu plating and CMP. Critical Dimension and overlay measurements for line-space pattern are done with SEM post litho, post etch and post Cu CMP. Various machine learning models are applied to do the capacitance prediction with multiple metrology inputs at different steps of wafer processing. Finally, we demonstrate that by using appropriate machine learning models we are able to do better prediction of electrical results.

eess.SP↗
arXiv2023

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy

In semiconductor manufacturing, lithography has often been the manufacturing step defining the smallest possible pattern dimensions. In recent years, progress has been made towards high-NA (Numerical Aperture) EUVL (Extreme-Ultraviolet-Lithography) paradigm, which promises to advance pattern shrinking (2 nm node and beyond). However, a significant increase in stochastic defects and the complexity of defect detection becomes more pronounced with high-NA. Present defect inspection techniques (both non-machine learning and machine learning based), fail to achieve satisfactory performance at high-NA dimensions. In this work, we investigate the use of the Slicing Aided Hyper Inference (SAHI) framework for improving upon current techniques. Using SAHI, inference is performed on size-increased slices of the SEM images. This leads to the object detector's receptive field being more effective in capturing small defect instances. First, the performance on previously investigated semiconductor datasets is benchmarked across various configurations, and the SAHI approach is demonstrated to substantially enhance the detection of small defects, by approx. 2x. Afterwards, we also demonstrated application of SAHI leads to flawless detection rates on a new test dataset, with scenarios not encountered during training, whereas previous trained models failed. Finally, we formulate an extension of SAHI that does not significantly reduce true-positive predictions while eliminating false-positive predictions.

cs.CV↗
arXiv2023

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization

As semiconductor patterning dimensions shrink, more advanced Scanning Electron Microscopy (SEM) image-based defect inspection techniques are needed. Recently, many Machine Learning (ML)-based approaches have been proposed for defect localization and have shown impressive results. These methods often rely on feature extraction from a full SEM image and possibly a number of regions of interest. In this study, we propose a deep Reinforcement Learning (RL)-based approach to defect localization which iteratively extracts features from increasingly smaller regions of the input image. We compare the results of 18 agents trained with different feature extractors. We discuss the advantages and disadvantages of different feature extractors as well as the RL-based framework in general for semiconductor defect localization.

cs.CV↗
arXiv2023

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE

The technological advance of High Numerical Aperture Extreme Ultraviolet Lithography (High NA EUVL) has opened the gates to extensive researches on thinner photoresists (below 30nm), necessary for the industrial implementation of High NA EUVL. Consequently, images from Scanning Electron Microscopy (SEM) suffer from reduced imaging contrast and low Signal-to-Noise Ratio (SNR), impacting the measurement of unbiased Line Edge Roughness (uLER) and Line Width Roughness (uLWR). Thus, the aim of this work is to enhance the SNR of SEM images by using a Deep Learning denoiser and enable robust roughness extraction of the thin resist. For this study, we acquired SEM images of Line-Space (L/S) patterns with a Chemically Amplified Resist (CAR) with different thicknesses (15nm, 20nm, 25nm, 30nm), underlayers (Spin-On-Glass-SOG, Organic Underlayer-OUL) and frames of averaging (4, 8, 16, 32, and 64 Fr). After denoising, a systematic analysis has been carried out on both noisy and denoised images using an open-source metrology software, SMILE 2.3.2, for investigating mean CD, SNR improvement factor, biased and unbiased LWR/LER Power Spectral Density (PSD). Denoised images with lower number of frames present unaltered Critical Dimensions (CDs), enhanced SNR (especially for low number of integration frames), and accurate measurements of uLER and uLWR, with the same accuracy as for noisy images with a consistent higher number of frames. Therefore, images with a small number of integration frames and with SNR < 2 can be successfully denoised, and advantageously used in improving metrology throughput while maintaining reliable roughness measurements for the thin resist.

cs.CV↗
arXiv2023

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical failures and wafer-yield limitations. As nodes and patterns get smaller, even high-resolution imaging techniques such as Scanning Electron Microscopy (SEM) produce noisy images due to operating close to sensitivity levels and due to varying physical properties of different underlayers or resist materials. This inherent noise is one of the main challenges for defect inspection. One promising approach is the use of machine learning algorithms, which can be trained to accurately classify and locate defects in semiconductor samples. Recently, convolutional neural networks have proved to be particularly useful in this regard. This systematic review provides a comprehensive overview of the state of automated semiconductor defect inspection on SEM images, including the most recent innovations and developments. 38 publications were selected on this topic, indexed in IEEE Xplore and SPIE databases. For each of these, the application, methodology, dataset, results, limitations and future work were summarized. A comprehensive overview and analysis of their methods is provided. Finally, promising avenues for future work in the field of SEM-based defect inspection are suggested.

cs.CV↗
arXiv2023

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection

Continual shrinking of pattern dimensions in the semiconductor domain is making it increasingly difficult to inspect defects due to factors such as the presence of stochastic noise and the dynamic behavior of defect patterns and types. Conventional rule-based methods and non-parametric supervised machine learning algorithms like KNN mostly fail at the requirements of semiconductor defect inspection at these advanced nodes. Deep Learning (DL)-based methods have gained popularity in the semiconductor defect inspection domain because they have been proven robust towards these challenging scenarios. In this research work, we have presented an automated DL-based approach for efficient localization and classification of defects in SEM images. We have proposed SEMI-CenterNet (SEMI-CN), a customized CN architecture trained on SEM images of semiconductor wafer defects. The use of the proposed CN approach allows improved computational efficiency compared to previously studied DL models. SEMI-CN gets trained to output the center, class, size, and offset of a defect instance. This is different from the approach of most object detection models that use anchors for bounding box prediction. Previous methods predict redundant bounding boxes, most of which are discarded in postprocessing. CN mitigates this by only predicting boxes for likely defect center points. We train SEMI-CN on two datasets and benchmark two ResNet backbones for the framework. Initially, ResNet models pretrained on the COCO dataset undergo training using two datasets separately. Primarily, SEMI-CN shows significant improvement in inference time against previous research works. Finally, transfer learning (using weights of custom SEM dataset) is applied from ADI dataset to AEI dataset and vice-versa, which reduces the required training time for both backbones to reach the best mAP against conventional training method.

cs.CV↗