arXiv subjects

Ruolun Zhang

Publications and source records attributed to Ruolun Zhang.

2 recordsLinked to original sources

arXiv2026

Dynamic twisting and imaging of moiré crystals

Moiré superlattices in stacked 2D crystals are powerful platforms for engineering correlated and topological quantum phases, with twisted graphene and transition metal dichalcogenides (TMDs) as prominent examples. Their angle-sensitive band structures enable rich tunability; however, conventional tear-and-stack methods fix the angle at assembly, limiting systematic exploration of angle-dependent phenomena. Here, we present a scanning-probe-based manipulation scheme that enables in situ, continuous post-fabrication twist control using nanostructured metal rotors. We demonstrate reproducible angle tuning and direct moiré imaging across three platforms: graphene, hBN, and encapsulated, air-sensitive MoTe2. Quantitative piezoresponse force microscopy (PFM) analysis confirms sub-degree precision with minimal induced heterostrain, preserving sample quality even in the marginally twisted regime. Crucially, the device architecture maintains open access to the active region, allowing optical, scanning-probe, and transport measurements. This work enables single-device mapping of the angular phase diagram of moiré materials, including the twisted TMD homobilayers.

cond-mat.mes-hall↗

arXiv2023

MilliKelvin microwave impedance microscopy in a dry dilution refrigerator

Microwave impedance microscopy (MIM) is a near-field imaging technique that has been used to visualize the local conductivity of materials with nanoscale resolution across the GHz regime. In recent years, MIM has shown great promise for the investigation of topological states of matter, correlated electronic states and emergent phenomena in quantum materials. To explore these low-energy phenomena, many of which are only detectable in the milliKelvin regime, we have developed a novel low-temperature MIM incorporated into a dilution refrigerator. This setup which consists of a tuning-fork-based atomic force microscope with microwave reflectometry capabilities, is capable of reaching temperatures down to 70 mK during imaging and magnetic fields up to 9 T. To test the performance of this microscope, we demonstrate microwave imaging of the conductivity contrast between graphite and silicon dioxide at cryogenic temperatures and discuss the resolution and noise observed in these results. We extend this methodology to visualize edge conduction in Dirac semimetal cadmium arsenide in the quantum Hall regime

physics.app-ph↗