Pramit Kumar Bhaduri | arXiv Science

arXiv2026

WARD: Runtime Workload-Adaptive Vision TRansformer Framework for Dependable Edge AI

Edge-deployed AI operate under dynamically changing power budgets, reliability requirements, and input distributions, requiring continuous adaptation. Such conditions arise in long-running edge AI applications, including autonomous systems, industrial monitoring, and satellite onboard intelligence. Existing fault-tolerant methods assume static operating conditions, whereas continual learning techniques neglect concurrent hardware faults during online adaptation. Moreover, the practical deployment of runtime-adaptive reliability frameworks on programmable AI accelerators remains largely unexplored. This paper presents WARD, a runtime-adaptive Vision Transformer framework that combines channel-wise subnetwork partitioning, reliability-aware continual learning, and dynamic operating-mode scheduling to jointly optimize performance, fault tolerance, and adaptation according to runtime conditions. Two physically isolated subnetworks execute under four operating modes (i.e. Full-Precision Mode, Low-Power Mode, High-Reliability Mode, and Adaptive Mode) that dynamically adjust computational cost and reliability while ensuring uninterrupted inference for real-time requirements. To validate the practical deployability of the proposed framework, WARD is implemented on a lightweight FPGA-based accelerator extended with runtime hardware support for mode scheduling and resource management. Experimental results demonstrate that the proposed split architecture achieves a network-level failure rate of only 1.79% under high Bit Error Rates. The hardware implementation incurs less than 5% area overhead and supports runtime mode transitions within few clock cycles, demonstrating that adaptive reliability management can be integrated into programmable edge AI accelerators with negligible implementation overhead.

cs.AR↗

arXiv2026

SENTRY: Statistical Reliability Analysis of Vision Transformers Under Soft Errors

With the growth of Vision Transformers in safety-critical domains like autonomous systems and medical imaging, ensuring their reliability against soft errors is paramount. While ViTs offer state-of-the-art accuracy, their massive parameter counts render exhaustive fault injection campaigns infeasible. To bridge this gap, a statistical fault injection framework is presented, leveraging finite-population sampling theory to provide formal reliability guarantees. It is demonstrated that failure rates are bounded within a 1% margin at 99\% confidence using only a few thousand samples, regardless of model scale. This methodology achieves up to a 10,700 times reduction in experimental cost compared to exhaustive approaches, while preserving the ability to localize vulnerabilities across architectural components. Through extensive evaluation of different architectures like ViT-Tiny and ViT-Small, a highly non-uniform reliability landscape is uncovered. It is shown that while only 3% of FP32 bit-flips result in failure, the vast majority of these events lead to catastrophic accuracy collapse. Specific vulnerabilities are localized to normalization layers and critical exponent bits within the IEEE-754 format, providing a mathematical foundation and actionable insights for the design of hardened, edge-deployed ViT architectures.

cs.CV↗