Bottom-Up Surface-Enhanced Raman Scattering for the Detection of Micro-Objects and Globular Analytes
Surface-enhanced Raman scattering (SERS) is typically achieved by depositing the analyte on a metal or semiconductor substrate. We propose a bottom-up approach, enabling SERS by depositing a metal on the surface of the object being studied. A Mie-theory analysis of electric-field enhancement in dielectric core-shell particles is presented. A correlative approach combining SERS, atomic force microscopy, and scanning electron microscopy is employed to model the conditions required for sensitive SERS detection and spectral analysis of polystyrene microspheres (PMSs) as models of globular and vesicle-like objects. Based on these findings, we propose a SERS-active system that provides strong signal enhancement (up to four orders of magnitude for a single globular object) while maintaining spectral fidelity, where PMSs act both as model analytes and as integral components of a metal-dielectric resonator.