Absorption and Phase-Contrast Microtomography Using Direct X-Ray Detection With Commercial Off-The-Shelf CMOS Sensors
This work presents high-resolution X-ray microtomography based on commercial off-the-shelf (COTS) CMOS image sensors as direct detectors. The system uses a microfocus X-ray source in cone-beam geometry, enabling both absorption-contrast imaging, thanks to the sensor s intrinsic resolution, and phase-contrast imaging, by adjusting the object-to-sensor distance. A dynamic flat-field correction algorithm mitigates radiation-induced sensor degradation during long acquisitions. The setup provides voxel sizes from 3.9 microns to 5.2 microns, with an effective spatial resolution (FWHM) as fine as 9.6 microns in magnified phase-contrast mode (1.33x) and 21 microns in non-magnified absorption-contrast mode. Phase contrast enhances visualization of soft tissue boundaries that are difficult to visualize using absorption-contrast imaging in the same experimental configuration.