Experiments and Modeling of Defect Dynamics and BTI Behavior in Doped InO TFTs during $400^\circ$C Post-Processing Forming Gas Annealing
We investigate the impact of a monolithic three-dimensional (M3D) integration process-critical $400^\circ$C post-processing forming gas anneal (FGA) on the electrical performance, reliability, and defect evolution of oxide-channel thin-film transistors (TFTs), combining systematic experiments with density-functional-theory (DFT)-based liquid-quench molecular-dynamics (MD) simulations. Indium tungsten oxide (IWO) TFTs are employed as a model system and encapsulated with a thin 3 nm Al$_2$O$_3$ / 3 nm HfO$_2$ hybrid layer that effectively suppresses external hydrogen ingress. We reveal a non-monotonic evolution of device behavior during FGA, governed by initial densification followed by partial crystallization. Short-duration FGA (10 min) induces channel densification and the formation of shallow, delocalized defect states, leading to pronounced positive bias temperature instability (PBTI) degradation and the emergence of a characteristic transfer-curve "kink." With prolonged annealing (>40 min), partial crystallization of the oxide channel occurs, stabilizing hydrogen in deep, localized defect states, suppressing hydrogen mobility, and restoring device reliability. As a result, the PBTI shift is reduced to 10.4 mV after 2000 seconds of stress, accompanied by complete elimination of the transfer-curve kink. These findings provide a mechanistic understanding of hydrogen-defect interactions during high-temperature post-processing FGA and demonstrate that appropriate hydrogen-blocking encapsulation enables oxide-channel TFT integration without compromising electrical performance or reliability.