arXiv subjects

Manar Abdelatty

Publications and source records attributed to Manar Abdelatty.

5 recordsLinked to original sources

arXiv2026

CovR: Coverage-Aware Hardware Verification via Reasoning-Guided Reinforcement Learning

Design verification remains one of the most resource-intensive stages of hardware development, often consuming up to 70% of the total design effort. While recent work has explored using Large Language Models (LLMs) to automate testbench generation, most existing approaches focus narrowly on functional correctness, overlooking the critical aspect of coverage quality. To bridge this gap, we present CovR, an agentic framework for automated testbench generation that combines self-reflection loops with simulation-based feedback to maximize coverage. Using this pipeline, we construct a large-scale dataset of 16,514 natural specification RTL reasoning testbench tuples with a strong teacher model, enabling coverage-aware supervision. Building on this, we propose a reinforcement learning (RL) framework tailored for coverage-driven testbench generation, leveraging tool-derived rewards from simulation and coverage feedback to optimize a student model. Experimental results show that the CovR finetuned model achieves 93.81% cov@10 on VerilogEval and RTLLM V2.0, and 87.76% cov@10 on CVDP, outperforming state-of-the-art approaches by 7.97% and 3.59%, respectively. Furthermore, deploying the finetuned model back into the agentic refinement pipeline further improves cov@10 to 94.27% on VerilogEval and RTLLM V2.0 and 91.39% on CVDP. Moreover, when integrated as a plug-in stimulus engine for full verification workflows, CovR improves coverage by 18.95% and mutation detection score by 1.19%, while revealing 4.46% undetected failures, highlighting the importance of optimizing for coverage in LLM-based hardware verification.

cs.AR↗

arXiv2025

Pluto: A Benchmark for Evaluating Efficiency of LLM-generated Hardware Code

Large Language Models (LLMs) are increasingly used to automate hardware design tasks, including the generation of Verilog code. While early benchmarks focus primarily on functional correctness, efficient hardware design demands additional optimization for synthesis metrics such as area, delay, and power. Existing benchmarks fall short in evaluating these aspects comprehensively: they often lack optimized baselines or testbenches for verification. To address these gaps, we present Pluto, a benchmark and evaluation framework designed to assess the efficiency of LLM-generated Verilog designs. Pluto presents a comprehensive evaluation set of 114 problems with self-checking testbenches and multiple Pareto-optimal reference implementations. Experimental results show that state-of-the-art LLMs can achieve high functional correctness, reaching 78.3\% at pass@1, but their synthesis efficiency still lags behind expert-crafted implementations, with area efficiency of 63.8\%, delay efficiency of 65.9\%, and power efficiency of 64.0\% at eff@1. This highlights the need for efficiency-aware evaluation frameworks such as Pluto to drive progress in hardware-focused LLM research.

cs.CL↗

arXiv2025

ChipXplore: Natural Language Exploration of Hardware Designs and Libraries

Hardware design workflows rely on Process Design Kits (PDKs) from different fabrication nodes, each containing standard cell libraries optimized for speed, power, or density. Engineers typically navigate between the design and target PDK to make informed decisions, such as selecting gates for area optimization or enhancing the speed of the critical path. However, this process is often manual, time-consuming, and prone to errors. To address this, we present ChipXplore, a multi-agent collaborative framework powered by large language models that enables engineers to query hardware designs and PDKs using natural language. By exploiting the structured nature of PDK and hardware design data, ChipXplore retrieves relevant information through text-to-SQL and text-to-Cypher customized workflows. The framework achieves an execution accuracy of 97.39\% in complex natural language queries and improves productivity by making retrieval 5.63x faster while reducing errors by 5.25x in user studies. Compared to generic workflows, ChipXplore's customized workflow is capable of orchestrating reasoning and planning over multiple databases, improving accuracy by 29.78\%. ChipXplore lays the foundation for building autonomous agents capable of tackling diverse physical design tasks that require PDK and hardware design awareness.

cs.CL↗

arXiv2025

MetRex: A Benchmark for Verilog Code Metric Reasoning Using LLMs

Large Language Models (LLMs) have been applied to various hardware design tasks, including Verilog code generation, EDA tool scripting, and RTL bug fixing. Despite this extensive exploration, LLMs are yet to be used for the task of post-synthesis metric reasoning and estimation of HDL designs. In this paper, we assess the ability of LLMs to reason about post-synthesis metrics of Verilog designs. We introduce MetRex, a large-scale dataset comprising 25,868 Verilog HDL designs and their corresponding post-synthesis metrics, namely area, delay, and static power. MetRex incorporates a Chain of Thought (CoT) template to enhance LLMs' reasoning about these metrics. Extensive experiments show that Supervised Fine-Tuning (SFT) boosts the LLM's reasoning capabilities on average by 37.0\%, 25.3\%, and 25.7\% on the area, delay, and static power, respectively. While SFT improves performance on our benchmark, it remains far from achieving optimal results, especially on complex problems. Comparing to state-of-the-art regression models, our approach delivers accurate post-synthesis predictions for 17.4\% more designs (within a 5\% error margin), in addition to offering a 1.7x speedup by eliminating the need for pre-processing. This work lays the groundwork for advancing LLM-based Verilog code metric reasoning.

cs.AR↗

arXiv2023

Microscale 3-D Capacitance Tomography with a CMOS Sensor Array

Electrical capacitance tomography (ECT) is a nonoptical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous ECT demonstrations have often been at centimeter scales, ECT is not limited to macroscopic systems. In this paper, we demonstrate ECT imaging of polymer microspheres and bacterial biofilms using a CMOS microelectrode array, achieving spatial resolution of 10 microns. Additionally, we propose a deep learning architecture and an improved multi-objective training scheme for reconstructing out-of-plane permittivity maps from the sensor measurements. Experimental results show that the proposed approach is able to resolve microscopic 3-D structures, achieving 91.5% prediction accuracy on the microsphere dataset and 82.7% on the biofilm dataset, including an average of 4.6% improvement over baseline computational methods.

cs.CV↗