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M. Steinert

Publications and source records attributed to M. Steinert.

2 recordsLinked to original sources

High Speed and High Resolution Table-Top Nanoscale Imaging

We present a table-top coherent diffraction imaging (CDI) experiment based on high-order harmonics generated at 18 nm by a high average power femtosecond fiber laser system. The high photon flux, narrow spectral bandwidth and high degree of spatial coherence allow for ultra-high sub-wavelength resolution imaging at a high numerical aperture. Our experiments demonstrate a half-pitch resolution of 13.6 nm, very close to the actual Abbe-limit of 12.4 nm, which is the highest resolution achieved from any table-top XUV or X-ray microscope. In addition, 20.5 nm resolution was achieved with only 3 sec of integration time bringing live diffraction imaging and 3D tomography on the nanoscale one step closer to reality. The current resolution is solely limited by the wavelength and the detector size. Thus, table-top nanoscopes with only a few-nm resolutions are in reach and will find applications in many areas of science and technology.

physics.optics

Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy

Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the transverse electric and magnetic field components of light. The discrimination of the individual field components is challenging, as these four field components are contained within two signals in the case of a polarization-resolved measurement. Here, we develop a methodology to solve the inverse imaging problem and to retrieve the vectorial field components from polarization- and phase-resolved measurements. Our methodology relies on the discussion of the image formation process in aperture based scanning near field optical microscopes. On this basis, we are also able to explain how the relative contributions of the electric and magnetic field components within detected images depend on the probe geometry, its material composition, and the illumination wavelength. This allows to design probes that are dominantly sensitive either to the electric or magnetic field components of light.

physics.optics