arXiv subjects

Haocong Luo

Publications and source records attributed to Haocong Luo.

At least 19 recordsLinked to original sources

arXiv2026

Demystifying DRAM Read Disturbance: Bridging the Gap Between Experimental Characterization and Device-Level Modeling of RowHammer and RowPress Phenomena

DRAM read disturbance, like RowHammer and RowPress, is a critical robustness issue where accessing DRAM can cause unintended bitflips in other unaccessed DRAM locations. DRAM read disturbance bitflips significantly impact the safe, secure, and reliable operation of DRAM-based computing systems. Many prior works experimentally characterize these bitflips and propose mitigations based on empirical results. Other device-level works study their underlying physical mechanisms, but these mechanisms do not fully explain all major empirical observations. Our goal is to bridge the gap between experimental characterization and device-level modeling and understanding of RowHammer and RowPress, providing a principled foundation for future work on understanding, characterizing, and mitigating DRAM read disturbance. We first identify and demonstrate gaps and inconsistencies between the physical mechanisms of RowHammer and RowPress described by existing device-level models and experimental characterization of their bitflips. We focus on three fundamental metrics that should map to first-order physical mechanisms: 1) bitflip directions, 2) bitflip counts, and 3) the minimum number of aggressor row activations that trigger the first bitflips (i.e., ACmin). Second, we present a comprehensive and rigorous set of TCAD simulations that match phenomena observed in experimental characterizations of RowHammer and RowPress bitflips. From our results, we 1) summarize updated device-level error mechanisms for understanding RowHammer and RowPress bitflips, and 2) identify key modeling and simulation parameters that significantly affect whether simulation results match real-chip characterization. We discuss implications for 1) rigorous, comprehensive, and efficient experimental characterization methodologies of DRAM read disturbance bitflips, and 2) the design of DRAM read disturbance mitigation techniques.

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arXiv2026

Clutch: High Performance Vector-Scalar Comparison using DRAM via Chunked Temporal Coding

Vector-scalar comparison is a fundamental computation primitive that compares each element in a vector against a single scalar value. It is widely used in various data-intensive workloads from databases to machine learning. Due to its low computational intensity, its execution tends to be memory-bound, limiting the utilization of compute resources. Processing-using-DRAM (PuD) is an emerging computing paradigm that performs massively parallel bitwise operations directly inside DRAM arrays, alleviating off-chip data movement. Existing PuD-based approaches require many DRAM commands because the comparison's algorithmic complexity grows with operand bit-width in the bit-serial execution model. This command overhead becomes the dominant bottleneck, limiting application-level speedup. We propose Clutch, a data representation and comparison algorithm that accelerates vector-scalar comparisons in PuD systems with high efficiency and scalability. Clutch first uses temporal coding, encoding each vector value as a sequence of leading ones, which enables lookup-based comparison against a scalar by accessing the corresponding DRAM row. To avoid the prohibitive memory footprint of lookup tables at high precision, Clutch partitions operands into multiple multi-bit chunks, compares chunks independently using compact lookup tables, and merges the per-chunk results with a PuD-efficient procedure. By adjusting the number of chunks, Clutch provides a flexible tradeoff between throughput and memory usage. Across predicate evaluation and decision tree inference, Clutch improves end-to-end application throughput and energy efficiency by an average of 12x and 69x over highly optimized CPU and GPU execution, and by 2.9x and 3.0x over the state-of-the-art bit-serial PuD implementation. We also present the first mapping of decision tree inference to PuD execution, extending PuD to a new application domain.

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arXiv2026

DejaVu: Why You Should Write to Your DRAM Rows Twice, Carefully

We provide the first experimental demonstration of DejaVu, a phenomenon where the data previously written to DRAM cells affects DRAM's vulnerability to read disturbance. Our experimental characterization using 112 COTS DDR4 DRAM chips from all three major manufacturers shows that, compared to the baseline where we initialize the victim row by writing to it only once, 1) overwriting it with the opposite data reduces ACmin, the minimum aggressor row activation count to induce a bitflip, and 2) writing the same data twice increases ACmin. We provide two hypotheses to explain DejaVu. First, we hypothesize that overwriting the victim row with opposite data values causes under-restoration of charge in DRAM cells. Second, we hypothesize that overwriting the victim row changes charge trap states in the active region, affecting read-disturbance-induced cell leakage current. We conduct controlled characterization to provide insight into these hypotheses. We further characterize the reliability of Processing-Using-DRAM (PUD) operations with DRAM rows initialized with DejaVu patterns. Our characterization of 32-row MAJ-3 operation shows that overwriting the DRAM rows used in the operation reduces the number of bitlines that fail to reliably perform MAJ-3 by 32.7% on average compared to the baseline where rows are written only once. Based on our observations, we describe two major implications of DejaVu. We show how DRAM testing and characterization methodologies should account for DejaVu to accurately characterize read disturbance vulnerability under fixed data patterns and rigorously study data-pattern effects without unintended interference from DejaVu. We also evaluate the performance overhead of read disturbance mitigation techniques when thresholds need to be lowered to be secure against DejaVu, showing a 6.3% overhead when reducing the threshold by 20%.

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arXiv2026

Ramulator 2.1: A Composable Memory System Simulator for Modern DRAM Systems

Ramulator 2.1 is a major overhaul of Ramulator 2.0 that substantially improves the simulator in three directions: 1) support of modern and emerging DRAM and memory-controller features, 2) better usability and extensibility of the simulator, and 3) more comprehensive tests and validation workflows. Ramulator 2.1 adds support for advanced features in recent and emerging DRAM standards and memory controllers, including HBM3/4, LPDDR5/6, and GDDR7. To improve usability and extensibility, Ramulator 2.1 introduces a Python-based modeling and configuration interface backed by a two-way code-generation framework that 1) hides low-level C++ code behind high-level DRAM specifications written in Python, and 2) automatically creates Python proxies for all components of the simulator. Doing so enables users to rapidly create variants of DRAM standards and automate design-space-exploration workflows. To improve trustworthiness in simulation results, Ramulator 2.1 provides a comprehensive testing and validation infrastructure that covers both 1) fine-grained validation of specific DRAM timing constraints and memory-controller scheduling behavior, and 2) system-level performance evaluation using latency-throughput curves. To aid performance analysis and debugging, Ramulator 2.1 also includes an easy-to-use and high-performance DRAM command trace visualizer. Ramulator 2.1 is open-source on GitHub and under active development.

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arXiv2026

PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems

Processing-using-DRAM (PuD) is a promising computation paradigm that alleviates frequent data movement between main memory and processing units by using each DRAM column as a computation engine via simultaneous multiple-row activation (SiMRA). Unfortunately, DRAM density scaling may hinder PuD's benefits: denser cell arrays bring rows and columns closer, making regular DRAM operations susceptible to noise and interference from neighboring cells. Yet no prior work investigates whether interference from rows or columns not intended to participate in computation can compromise PuD robustness. In this work, we reveal PuDGhost, an interference phenomenon where a PuD operation in a given column produces erroneous results due to interference from 1) data in non-activated DRAM rows and 2) data in other columns that compute concurrently under the same SiMRA operation. PuDGhost violates the ideal picture that each column's computation depends solely on its own operand data, threatening future PuD systems. We present the first extensive characterization of PuDGhost using 96 real DDR4 DRAM chips from 12 modules, quantifying these two interference sources under various conditions. Among our 15 new empirical observations, we highlight two major results: 1) data in adjacent non-activated rows affects SiMRA outputs by up to 10% for random inputs, and 2) data in concurrently computing columns affects SiMRA outputs by up to 48% for random inputs. Guided by these findings, we propose countermeasures across multiple layers of the PuD computing stack. Specifically, we evaluate on real DDR4 DRAM chips: 1) robust column screening that reduces the risk of using unreliable columns in the presence of PuDGhost, and 2) a compute row layout that mitigates PuDGhost via dedicated rows between compute rows. Our solutions greatly improve PuD computation accuracy and provide a foundation for robust future PuD systems.

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arXiv2026

Extended Abstract: Re-Evaluating the Real-System Modeling Accuracy of Ramulator 2.0

Cycle-level DRAM simulators provide accurate and flexible models for DRAM and memory controller operations and enable research on current and future memory systems. Therefore, they are critical for improving the performance, efficiency, and robustness of DRAM-based memory systems. Ramulator 2.0 (successor of Ramulator) is a highly modular and extensible cycle-accurate DRAM simulator that enables rapid exploration of new ideas in DRAM-based memory systems. A MICRO 2024 best paper runner-up publication, A Mess of Memory System Benchmarking, Simulation and Application Profiling, which we refer to as "the Mess paper," with all three artifact badges awarded (including "Reproducible"), proposes a new benchmark to evaluate real and simulated memory system performance. While doing so, it makes strong negative claims about Ramulator 2.0 and shows unexpected results. In this talk and the associated extended abstract, we demonstrate that these results and claims in the Mess paper are incorrect and are due to configuration and simulator usage errors made in the Mess paper. We describe four best practices to aid users and developers of simulation tools to avoid such issues in the future. We emphasize the importance of contacting simulator authors and developers when unexpected results are observed (especially and importantly before publishing such results), to ensure these simulators are used with correct configurations and as intended. Our investigation also aims to stimulate discussion on artifact evaluation practices and on mechanisms for correcting results and artifacts after publication. To aid future works and reproduction of all our results, we open source all our code and scripts at https://github.com/CMU-SAFARI/Cleaning-up-the-Mess. We refer the reader to our full ISPASS 2026 paper and its artifact for the complete analysis, detailed methodology, and extended results.

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arXiv2026

A Modern Large-Scale Memory Characterization Laboratory

Real memory chip characterization yields insights into fundamental operational characteristics of modern memory, enabling new mechanisms that improve memory performance, robustness, security, and energy efficiency. We describe our large-scale DRAM characterization laboratory for understanding DRAM. A key building block of this laboratory is DRAM Bender, a versatile and easy-to-use modern DRAM characterization infrastructure. We have updated DRAM Bender to i) introduce support for new types of characterization experiments, ii) expand on its DRAM interface standard support, and iii) make it easier to use at large scale. This paper introduces these updates for the first time. We hope our infrastructure enables the community to discover new problems and solve critical memory scaling issues, enabling the overcoming of the huge memory bottleneck that plagues modern computing systems.

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arXiv2026

ScaleDisturb: Exploiting Temporal Asymmetry to Amplify Read Disturbance in Modern DRAM Chips

DRAM suffers from read disturbance phenomena (e.g., RowHammer and RowPress), where repeatedly accessing or continuously keeping open a DRAM row (aggressor row) induces bitflips in other physically nearby unaccessed rows (victim rows). The disturbance mechanism is practically exploitable from the software stack and worsens across generations with continued density scaling. DRAM read disturbance is highly sensitive to memory access patterns, yet prior work explores read disturbance under only a limited set of access patterns. We present ScaleDisturb, a new DRAM access pattern that can amplify DRAM read disturbance by asymmetrically extending the open time of two aggressor rows. Our rigorous experimental characterization of 196 DDR4 and 3 HBM2 DRAM chips shows that ScaleDisturb (1) leads to bitflips at significantly fewer row activations, compared to state-of-the-art memory access patterns, (2) makes read disturbance attacks easier across all tested DRAM chips, (3) increases DRAM vulnerability to read disturbance as DRAM manufacturing technology scales down to smaller node sizes. We showcase a proof-of-concept attack on a real system where a user-level program leveraging ScaleDisturb induces more bitflips than state-of-the-art RowHammer and RowPress memory access patterns. We describe and evaluate four solutions for mitigating read disturbance bitflips in the presence of ScaleDisturb and call for more research on the topic.

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arXiv2026

Cleaning up the Mess: Re-Evaluating the Real-System Modeling Accuracy of Ramulator 2.0

A MICRO 2024 best paper runner-up publication (the Mess paper) with all three artifact badges awarded (including ``Reproducible'') proposes a new benchmark to evaluate real and simulated memory system performance. The publication contends that Ramulator 2.0 and DAMOV (ZSim+Ramulator) (along with other existing memory system simulators) ``poorly resemble the actual system performance'' and asserts that their simulator is better. In this paper, we show that the Mess paper has 1) demonstrable technical misconfigurations, 2) methodological errors in interpreting simulation statistics, and 3) an incomplete artifact that makes its key results irreproducible. We demonstrate that the Ramulator 2.0 simulation results reported in the Mess paper are incorrect due to multiple configuration errors instead of inherent simulation inaccuracy claimed by the Mess paper. We show that by correctly configuring Ramulator 2.0, Ramulator 2.0's simulated memory system performance actually resembles real system characteristics well, and thus a key claimed contribution of the Mess paper is factually incorrect. We also identify that the DAMOV simulation results in the Mess paper use wrong simulation statistics that are unrelated to the simulated DRAM performance. We show that DAMOV's simulated DRAM latency is not constant, in contrast to the Mess paper's claim. Moreover, the Mess paper's artifact repository lacks the necessary sources to fully reproduce all the Mess paper's results. We find that the experiment scripts use simulator executables and other resources that are neither described in the Mess paper nor found in the artifact repository. We strongly encourage the computer architecture community to consider our corrections to the Ramulator 2.0 and DAMOV results of the Mess paper to prevent the propagation of inaccurate and misleading results and to maintain the reliability of the scientific record.

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arXiv2026

DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips

State-of-the-art DRAM read disturbance mitigations rely on the read disturbance threshold (RDT) (e.g., the number of aggressor row activations needed to induce the first read disturbance bitflip) to securely and performance- and energy-efficiently prevent read disturbance bitflips. However, accurately and exhaustively characterizing the RDT of every DRAM row in a chip is time intensive. Rapidly determining RDT is important for enabling secure, performance- and energy-efficient systems. Our goal is to develop and evaluate a reliable and rapid read disturbance testing methodology. To that end, we develop DiscoRD building on the key results of an extensive experimental characterization study using 212 real DDR4 chips whereby we measure the RDT of hundreds of thousands of DRAM rows millions of times. We develop an empirical model for read disturbance bitflips and evaluate the probability of read-disturbance-induced uncorrectable errors when a read disturbance mechanism is configured using a single $RDT_{min}$ measurement. Using this model we demonstrate that 1) relying on a lightweight error-correcting code (ECC) alone yields relatively high uncorrectable error probability and 2) combining ECC, infrequent memory scrubbing, and configurable read disturbance mitigation mechanisms can greatly reduce the error probability. Building on our observations and analyses, we discuss the RDT of each individual row can be identified more precisely. Our results show that error tolerance, memory scrubbing, online profiling, and run-time configurable read disturbance mitigation techniques are important to enable secure and energy-efficient spatial-variation aware read disturbance mitigations. We hope that DiscoRD drives research that enables us to quantitatively navigate the performance/cost - reliability tradeoff space for read disturbance mitigation techniques.

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arXiv2025

DRAM Bender: An Extensible and Versatile FPGA-based Infrastructure to Easily Test State-of-the-art DRAM Chips

To understand and improve DRAM performance, reliability, security and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such studies are obsolete, poorly supported, or difficult to use, or their inflexibility limit the types of studies they can conduct. We propose DRAM Bender, a new FPGA-based infrastructure that enables experimental studies on state-of-the-art DRAM chips. DRAM Bender offers three key features at the same time. First, DRAM Bender enables directly interfacing with a DRAM chip through its low-level interface. This allows users to issue DRAM commands in arbitrary order and with finer-grained time intervals compared to other open source infrastructures. Second, DRAM Bender exposes easy-to-use C++ and Python programming interfaces, allowing users to quickly and easily develop different types of DRAM experiments. Third, DRAM Bender is easily extensible. The modular design of DRAM Bender allows extending it to (i) support existing and emerging DRAM interfaces, and (ii) run on new commercial or custom FPGA boards with little effort. To demonstrate that DRAM Bender is a versatile infrastructure, we conduct three case studies, two of which lead to new observations about the DRAM RowHammer vulnerability. In particular, we show that data patterns supported by DRAM Bender uncovers a larger set of bit-flips on a victim row compared to the data patterns commonly used by prior work. We demonstrate the extensibility of DRAM Bender by implementing it on five different FPGAs with DDR4 and DDR3 support. DRAM Bender is freely and openly available at https://github.com/CMU-SAFARI/DRAM-Bender.

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arXiv2025

ColumnDisturb: Understanding Column-based Read Disturbance in Real DRAM Chips and Implications for Future Systems

We experimentally demonstrate a new widespread read disturbance phenomenon, ColumnDisturb, in real commodity DRAM chips. By repeatedly opening or keeping a DRAM row (aggressor row) open, we show that it is possible to disturb DRAM cells through a DRAM column (i.e., bitline) and induce bitflips in DRAM cells sharing the same columns as the aggressor row (across multiple DRAM subarrays). With ColumnDisturb, the activation of a single row concurrently disturbs cells across as many as three subarrays (e.g., 3072 rows) as opposed to RowHammer/RowPress, which affect only a few neighboring rows of the aggressor row in a single subarray. We rigorously characterize ColumnDisturb and its characteristics under various operational conditions using 216 DDR4 and 4 HBM2 chips from three major manufacturers. Among our 27 key experimental observations, we highlight two major results and their implications. First, ColumnDisturb affects chips from all three major manufacturers and worsens as DRAM technology scales down to smaller node sizes (e.g., the minimum time to induce the first ColumnDisturb bitflip reduces by up to 5.06x). We observe that, in existing DRAM chips, ColumnDisturb induces bitflips within a standard DDR4 refresh window (e.g., in 63.6 ms) in multiple cells. We predict that, as DRAM technology node size reduces, ColumnDisturb would worsen in future DRAM chips, likely causing many more bitflips in the standard refresh window. Second, ColumnDisturb induces bitflips in many (up to 198x) more rows than retention failures. Therefore, ColumnDisturb has strong implications for retention-aware refresh mechanisms that leverage the heterogeneity in cell retention times: our detailed analyses show that ColumnDisturb greatly reduces the benefits of such mechanisms.

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arXiv2025

Chronus: Understanding and Securing the Cutting-Edge Industry Solutions to DRAM Read Disturbance

We 1) present the first rigorous security, performance, energy, and cost analyses of the state-of-the-art on-DRAM-die read disturbance mitigation method, Per Row Activation Counting (PRAC) and 2) propose Chronus, a new mechanism that addresses PRAC's two major weaknesses. Our analysis shows that PRAC's system performance overhead on benign applications is non-negligible for modern DRAM chips and prohibitively large for future DRAM chips that are more vulnerable to read disturbance. We identify two weaknesses of PRAC that cause these overheads. First, PRAC increases critical DRAM access latency parameters due to the additional time required to increment activation counters. Second, PRAC performs a constant number of preventive refreshes at a time, making it vulnerable to an adversarial access pattern, known as the wave attack, and consequently requiring it to be configured for significantly smaller activation thresholds. To address PRAC's two weaknesses, we propose a new on-DRAM-die RowHammer mitigation mechanism, Chronus. Chronus 1) updates row activation counters concurrently while serving accesses by separating counters from the data and 2) prevents the wave attack by dynamically controlling the number of preventive refreshes performed. Our performance analysis shows that Chronus's system performance overhead is near-zero for modern DRAM chips and very low for future DRAM chips. Chronus outperforms three variants of PRAC and three other state-of-the-art read disturbance solutions. We discuss Chronus's and PRAC's implications for future systems and foreshadow future research directions. To aid future research, we open-source our Chronus implementation at https://github.com/CMU-SAFARI/Chronus.

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arXiv2025

Self-Managing DRAM: A Low-Cost Framework for Enabling Autonomous and Efficient in-DRAM Operations

The memory controller is in charge of managing DRAM maintenance operations (e.g., refresh, RowHammer protection, memory scrubbing) to reliably operate modern DRAM chips. Implementing new maintenance operations often necessitates modifications in the DRAM interface, memory controller, and potentially other system components. Such modifications are only possible with a new DRAM standard, which takes a long time to develop, likely leading to slow progress in the adoption of new architectural techniques in DRAM chips. We propose a new low-cost DRAM architecture, Self-Managing DRAM (SMD), that enables autonomous in-DRAM maintenance operations by transferring the responsibility for controlling maintenance operations from the memory controller to the SMD chip. To enable autonomous maintenance operations, we make a single modification to the DRAM interface, such that an SMD chip rejects memory controller accesses to DRAM regions under maintenance, while allowing memory accesses to others. Thus, SMD enables 1) implementing new in-DRAM maintenance mechanisms (or modifying existing ones) with no further changes in the DRAM interface or other system components, and 2) overlapping the latency of a maintenance operation in one DRAM region with the latency of accessing data in another. We evaluate SMD and show that it 1) can be implemented without adding new pins to the DDRx interface with low latency and area overhead, 2) achieves 4.1% average speedup across 20 four-core memory-intensive workloads over a DDR4-based system/DRAM co-design technique that intelligently parallelizes maintenance operations with memory accesses, and 3) guarantees forward progress for rejected memory accesses. We believe and hope SMD can enable innovations in DRAM architecture to rapidly come to fruition. We open source all SMD source code and data at https://github.com/CMU-SAFARI/SelfManagingDRAM.

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arXiv2025

PuDHammer: Experimental Analysis of Read Disturbance Effects of Processing-using-DRAM in Real DRAM Chips

Processing-using-DRAM (PuD) is a promising paradigm for alleviating the data movement bottleneck using DRAM's massive internal parallelism and bandwidth to execute very wide operations. Performing a PuD operation involves activating multiple DRAM rows in quick succession or simultaneously, i.e., multiple-row activation. Multiple-row activation is fundamentally different from conventional memory access patterns that activate one DRAM row at a time. However, repeatedly activating even one DRAM row (e.g., RowHammer) can induce bitflips in unaccessed DRAM rows because modern DRAM is subject to read disturbance. Unfortunately, no prior work investigates the effects of multiple-row activation on DRAM read disturbance. In this paper, we present the first characterization study of read disturbance effects of multiple-row activation-based PuD (which we call PuDHammer) using 316 real DDR4 DRAM chips from four major DRAM manufacturers. Our detailed characterization show that 1) PuDHammer significantly exacerbates the read disturbance vulnerability, causing up to 158.58x reduction in the minimum hammer count required to induce the first bitflip ($HC_{first}$), compared to RowHammer, 2) PuDHammer is affected by various operational conditions and parameters, 3) combining RowHammer with PuDHammer is more effective than using RowHammer alone to induce read disturbance error, e.g., doing so reduces $HC_{first}$ by 1.66x on average, and 4) PuDHammer bypasses an in-DRAM RowHammer mitigation mechanism (Target Row Refresh) and induces more bitflips than RowHammer. To develop future robust PuD-enabled systems in the presence of PuDHammer, we 1) develop three countermeasures and 2) adapt and evaluate the state-of-the-art RowHammer mitigation standardized by industry, called Per Row Activation Counting (PRAC). We show that the adapted PRAC incurs large performance overheads (48.26%, on average).

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arXiv2025

Revisiting DRAM Read Disturbance: Identifying Inconsistencies Between Experimental Characterization and Device-Level Studies

Modern DRAM is vulnerable to read disturbance (e.g., RowHammer and RowPress) that significantly undermines the robust operation of the system. Repeatedly opening and closing a DRAM row (RowHammer) or keeping a DRAM row open for a long period of time (RowPress) induces bitflips in nearby unaccessed DRAM rows. Prior works on DRAM read disturbance either 1) perform experimental characterization using commercial-off-the-shelf (COTS) DRAM chips to demonstrate the high-level characteristics of the read disturbance bitflips, or 2) perform device-level simulations to understand the low-level error mechanisms of the read disturbance bitflips. In this paper, we attempt to align and cross-validate the real-chip experimental characterization results and state-of-the-art device-level studies of DRAM read disturbance. To do so, we first identify and extract the key bitflip characteristics of RowHammer and RowPress from the device-level error mechanisms studied in prior works. Then, we perform experimental characterization on 96 COTS DDR4 DRAM chips that directly match the data and access patterns studied in the device-level works. Through our experiments, we identify fundamental inconsistencies in the RowHammer and RowPress bitflip directions and access pattern dependence between experimental characterization results and the device-level error mechanisms. Based on our results, we hypothesize that either 1) the retention failure based DRAM architecture reverse-engineering methodologies do not fully work on modern DDR4 DRAM chips, or 2) existing device-level works do not fully uncover all the major read disturbance error mechanisms. We hope our findings inspire and enable future works to build a more fundamental and comprehensive understanding of DRAM read disturbance.

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arXiv2025

Variable Read Disturbance: An Experimental Analysis of Temporal Variation in DRAM Read Disturbance

Modern DRAM chips are subject to read disturbance errors. State-of-the-art read disturbance mitigations rely on accurate and exhaustive characterization of the read disturbance threshold (RDT) (e.g., the number of aggressor row activations needed to induce the first RowHammer or RowPress bitflip) of every DRAM row (of which there are millions or billions in a modern system) to prevent read disturbance bitflips securely and with low overhead. We experimentally demonstrate for the first time that the RDT of a DRAM row significantly and unpredictably changes over time. We call this new phenomenon variable read disturbance (VRD). Our experiments using 160 DDR4 chips and 4 HBM2 chips from three major manufacturers yield two key observations. First, it is very unlikely that relatively few RDT measurements can accurately identify the RDT of a DRAM row. The minimum RDT of a DRAM row appears after tens of thousands of measurements (e.g., up to 94,467), and the minimum RDT of a DRAM row is 3.5X smaller than the maximum RDT observed for that row. Second, the probability of accurately identifying a row's RDT with a relatively small number of measurements reduces with increasing chip density or smaller technology node size. Our empirical results have implications for the security guarantees of read disturbance mitigation techniques: if the RDT of a DRAM row is not identified accurately, these techniques can easily become insecure. We discuss and evaluate using a guardband for RDT and error-correcting codes for mitigating read disturbance bitflips in the presence of RDTs that change unpredictably over time. We conclude that a >10% guardband for the minimum observed RDT combined with SECDED or Chipkill-like SSC error-correcting codes could prevent read disturbance bitflips at the cost of large read disturbance mitigation performance overheads (e.g., 45% performance loss for an RDT guardband of 50%).

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arXiv2024

PIM-Opt: Demystifying Distributed Optimization Algorithms on a Real-World Processing-In-Memory System

Modern Machine Learning (ML) training on large-scale datasets is a very time-consuming workload. It relies on the optimization algorithm Stochastic Gradient Descent (SGD) due to its effectiveness, simplicity, and generalization performance. Processor-centric architectures (e.g., CPUs, GPUs) commonly used for modern ML training workloads based on SGD are bottlenecked by data movement between the processor and memory units due to the poor data locality in accessing large datasets. As a result, processor-centric architectures suffer from low performance and high energy consumption while executing ML training workloads. Processing-In-Memory (PIM) is a promising solution to alleviate the data movement bottleneck by placing the computation mechanisms inside or near memory. Our goal is to understand the capabilities of popular distributed SGD algorithms on real-world PIM systems to accelerate data-intensive ML training workloads. To this end, we 1) implement several representative centralized parallel SGD algorithms on the real-world UPMEM PIM system, 2) rigorously evaluate these algorithms for ML training on large-scale datasets in terms of performance, accuracy, and scalability, 3) compare to conventional CPU and GPU baselines, and 4) discuss implications for future PIM hardware and highlight the need for a shift to an algorithm-hardware codesign. Our results demonstrate three major findings: 1) The UPMEM PIM system can be a viable alternative to state-of-the-art CPUs and GPUs for many memory-bound ML training workloads, especially when operations and datatypes are natively supported by PIM hardware, 2) it is important to carefully choose the optimization algorithms that best fit PIM, and 3) the UPMEM PIM system does not scale approximately linearly with the number of nodes for many data-intensive ML training workloads. We open source all our code to facilitate future research.

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