arXiv subjects

Dihui Wang

Publications and source records attributed to Dihui Wang.

5 recordsLinked to original sources

arXiv2026

Identifiability of the three-dimensional anisotropic thermal-conductivity tensor in thermoreflectance measurements: Single-orientation limits and full-tensor recover

Materials with full anisotropic thermal conductivity tensors are widely used in advanced applications, creating a need for dedicated characterization. Such tensors contain six independent components: three diagonal conductivities and three non-zero off-diagonal couplings. However, whether thermoreflectance measurements on a single crystalline orientation can uniquely determine an arbitrary tensor remains unclear. Here, we show that every fully anisotropic thermal-conductivity tensor admits a Schur-equivalent tensor with zero cross-plane couplings ($k_{xz}=k_{yz}=0$). The two tensors produce identical surface thermal responses, and this equivalence persists as frequency, delay time, beam geometry, and spatial offset vary. We further demonstrate that parameter-identifiability assessments based on heuristic interpretations of sensitivity trends or singular-value decomposition (SVD) of the sensitivity matrix cannot, by themselves, rule out globally equivalent solutions in fully anisotropic systems. Combining systematic analysis with numerical validation, we provide guidance on selecting signals and measurement orientations for full-tensor characterization. Specifically, measurements at three mutually orthogonal crystallographic orientations provide complementary information for full-tensor recovery. These findings clarify the limits of single-surface measurements and establish a systematic approach to characterizing fully anisotropic thermal-conductivity tensors.

physics.app-ph↗

arXiv2026

Anisotropic Thermal Characterization of Suspended and Spin-Coated Polyimide Films Using a Square-Pulsed Source Method

Polyimide (PI) thin films are widely used in advanced technologies, yet accurate characterization of their thermal properties remains challenging, as evidenced by significant inconsistencies in reported data and an incomplete understanding of heat transfer mechanisms. In this study, we employ an optical Square-Pulsed Source (SPS) technique to simultaneously measure the in-plane and cross-plane thermal conductivities, as well as the volumetric heat capacity, of PI thin films. SPS is a pump-probe method that utilizes a square-wave-modulated pump laser to induce periodic heating and a probe laser to detect the thermoreflectance response. Thermal properties are extracted by analyzing amplitude signals across multiple modulation frequencies and laser spot sizes. Measurements were conducted on both suspended commercial PI films and spin-coated PI films on fused silica substrates. The results show that spin-coated films exhibit higher cross-plane thermal conductivity and lower anisotropy compared to suspended films, which we attribute to differences in molecular orientation and substrate interactions. These findings provide new physical insights into anisotropic heat transport in polymer thin films and demonstrate the SPS technique as a robust tool for probing microscale thermal phenomena in soft materials.

physics.app-ph↗

arXiv2025

Three-dimensional (3D) tensor-based methodology for characterizing 3D anisotropic thermal conductivity tensor

The increasing complexity of advanced materials with anisotropic thermal properties necessitates more generic and efficient methods to determine three-dimensional (3D) anisotropic thermal conductivity tensors with up to six independent components. Current methods rely on a vector-based framework that can handle only up to four independent components, often leading to inefficiencies and inaccuracies. We introduce Three-Dimensional Spatially Resolved Lock-In Micro-Thermography (3D SR-LIT), a novel optical thermal characterization technique combining a 3D tensor-based framework with an efficient area-detection experimental system. For simple tensors (e.g., x-cut quartz, k_xz=k_yz=0), our method reduces uncertainty by over 50% compared to vector-based methods. For complex tensors with six independent components (e.g., AT-cut quartz), 2σ uncertainties remain below 12% for all components. A novel adaptive mapping approach enables high-throughput data acquisition (40 seconds to 3 minutes, depending on tensor complexity), over 35 times faster than current methods, and accommodates samples with 200 nm surface roughness. Extensive numerical validation on 1,000 arbitrary anisotropic tensors ranging from 1 to 1,000 Wm^(-1) K^(-1) further validates the robustness of this methodology. This work highlights significant advancements in thermal characterization of complex anisotropic materials.

cond-mat.mtrl-sci↗

arXiv2024

Spatially resolved lock-in micro-thermography (SR-LIT): A tensor analysis-enhanced method for anisotropic thermal characterization

While high-throughput (HT) computations have streamlined the discovery of promising new materials, experimental characterization remains challenging and time-consuming. One significant bottleneck is the lack of an HT thermal characterization technique capable of analyzing advanced materials exhibiting varying surface roughness and in-plane anisotropy. To tackle these challenges, we introduce spatially resolved lock-in micro-thermography (SR-LIT), an innovative technique enhanced by tensor analysis for optical thermal characterization. Our comprehensive analysis and experimental findings showcase notable advancements: We present a novel tensor-based methodology that surpasses the limitations of vector-based analysis prevalent in existing techniques, significantly enhancing the characterization of arbitrary in-plane anisotropic thermal conductivity tensors. On the instrumental side, we introduce a straightforward camera-based detection system that, when combined with the tensor-based methodology, enables HT thermal measurements. This technique requires minimal sample preparation and enables the determination of the entire in-plane thermal conductivity tensor with a single data acquisition lasting under 40 seconds, demonstrating a time efficiency over 90 times superior to state-of-the-art HT thermology. Additionally, our method accommodates millimeter-sized samples with poor surface finish, tolerating surface roughness up to 3.5 μm. These features highlight an innovative approach to realizing HT and accurate thermal characterization across various research areas and real-world applications.

physics.app-ph↗

arXiv2022

A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity

In-plane thermal conductivities of small-scale samples are hard to measure, especially for the lowly conductive ones and those lacking in-plane symmetry (i.e., transversely anisotropic materials). State-of-the-art pump-probe techniques including both the time-domain and the frequency-domain thermoreflectance (TDTR and FDTR) are advantageous in measuring the thermal conductivity of small-scale samples, and various advanced TDTR and FDTR techniques have been developed to measure transversely anisotropic materials. However, the measurable in-plane thermal conductivity (k_in) is usually limited to be >10 W/(m K). In this work, a new spatial-scan thermoreflectance (SSTR) method has been developed to measure a broad range of k_in of millimeter-scale small samples, including those lacking in-plane symmetry, extending the current limit of the measurable k_in to as low as 1 W/(m K). This SSTR method establishes a new scheme of measurements using the optimized laser spot size and modulation frequency and a new scheme of data processing, enabling measurements of in-plane thermal conductivity tensors of a broad range of k_in values with both high accuracy and ease of operation. Some details such as the requirement on the sample geometry, the effect of the transducer layer, and the effect of heat loss are also discussed. As a verification, the k_in of some transversely isotropic reference samples with a wide range of k_in values including fused silica, sapphire, silicon, and highly ordered pyrolytic graphite (HOPG) have been measured using this new SSTR method. The measured k_in agree perfectly well with the literature values with a typical uncertainty of 5%. As a demonstration of the unique capability of this method, the in-plane thermal conductivity tensor of x-cut quartz, an in-plane anisotropic material, has also been measured.

cond-mat.mtrl-sci↗