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Bryan Sanchez

Publications and source records attributed to Bryan Sanchez.

4 recordsLinked to original sources

Correcting Suppressed Log-Probabilities in Language Models with Post-Transformer Adapters

Alignment-tuned language models frequently suppress factual log-probabilities on politically sensitive topics despite retaining the knowledge in their hidden representations. We show that a 786K-parameter (approximately 0.02% of the base model) post-transformer adapter, trained on frozen hidden states, corrects this suppression on 31 ideology-discriminating facts across Qwen3-4B, 8B, and 14B. The adapter memorizes all 15 training facts and generalizes to 11--39% of 16 held-out facts across 5 random splits per scale, with zero knowledge regressions via anchored training. Both gated (SwiGLU) and ungated (linear bottleneck) adapters achieve comparable results; neither consistently outperforms the other (Fisher exact p > 0.09 at all scales). On instruct models, the adapter corrects log-probability rankings. When applied at all token positions during generation, the adapter produces incoherent output; however, when applied only at the current prediction position (last-position-only), the adapter produces coherent, less censored text. A logit-space adapter operating after token projection fails to produce coherent generation at any application mode, suggesting hidden-state intervention is the correct level for generation correction. A previously undocumented silent gradient bug in Apple MLX explains all null results in earlier iterations of this work: the standard pattern nn.value_and_grad(model, fn)(model.parameters()) returns zero gradients without error; the correct pattern nn.value_and_grad(model, fn)(model, data) resolves this. We provide a minimal reproduction and discuss implications for other adapter research using MLX.

cs.CL

Lipschitz Bounds and Uniform Convergence for Sequences of Bounded Rough Riemannian Metrics

Here we study what we call bounded rough Riemannian metrics $(M,g)$, which are positive definite, symmetric tensors on each tangent space, $T_pM$, which are bounded and measurable as functions in coordinates. This is enough structure to study the length space given by taking the infimum of the length of all piecewise smooth curves connecting points $p,q \in M$. The goal is to find the weakest conditions one can place on $g$ which can guarantee Lipschitz or uniform bounds from above and below. For each condition, an example is given showing that the condition cannot be weakened any further which also explores the geometric intuition.

math.DG

Compactness of Sequences of Warped Product Length Spaces

If we consider a sequence of warped product length spaces, what conditions on the sequence of warping functions implies compactness of the sequence of distance functions? In particular, we want to know when a subsequence converges to a well defined metric space on the same manifold with the same topology. What conditions on the sequence of warping functions implies Lipschitz bounds for the sequence of distance functions and/or the limiting distance function? In this paper we give answers to both of these questions as well as many examples which elucidate the theorems and show that our hypotheses are necessary.

math.DG

Multi defect detection and analysis of electron microscopy images with deep learning

Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.

cs.CV