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Atik Shahariar

Publications and source records attributed to Atik Shahariar.

2 recordsLinked to original sources

MAOL: Morphology-Aware Ordinal Learning for Fine-Grained Industrial Defect Severity Grading

Fine-grained defect severity grading is essential for industrial inspection, yet remains challenging due to the ordinal nature of severity labels, the strong dependence on morphology-related cues, and the train-test discrepancy between clean annotated instances and noisy predicted instances in two-stage pipelines. We propose MAOL, a Morphology-Aware Ordinal Learning framework for fine-grained industrial defect severity grading. MAOL formulates severity grading as an instance-level ordinal learning task, incorporates explicit morphological features to enhance representation learning, introduces class-conditional adaptive ordinal thresholds to model defect-specific grading boundaries, and employs prediction-aware training via localization perturbation to improve robustness to imperfect predicted instances. Extensive experiments under both clean-ROI and predicted-instance settings demonstrate that MAOL consistently outperforms rule-based methods, nominal classification models, and existing ordinal baselines, especially in the predicted-instance setting. The proposed approach ranked third in the IDA 2026 Challenge on Fine-Grained Severity Grading for High-Precision Manufacturing.

cs.CV

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.

cs.CV