arXiv subjects

Atik Shahariar

Publications and source records attributed to Atik Shahariar.

3 recordsLinked to original sources

arXiv2026

Robust Online Aero-Engine Blade Defect Detection via Dual-Alignment Test-Time Adaptation

Reliable visual inspection is essential for quality assurance in aero-engine blade manufacturing, where defect appearance may vary across production lines, imaging conditions, blade poses, and surface backgrounds. Such domain shifts cause a mismatch between training and deployment data and degrade the reliability of deep defect detectors in online inspection. This problem is particularly challenging because aero-engine blade images usually contain sparse defects, making pseudolabel-based adaptation vulnerable to noisy or missing predictions. To address this issue, we propose Aero-engine Blade Defect Detector (ABDD), an online adaptive detection framework based on test-time adaptation. ABDD introduces a Dual-Alignment Strategy to jointly adapt global visual style and local defect morphology by combining feature-statistics alignment with pseudo-box alignment. To reduce error accumulation from unreliable pseudo labels, an Uncertainty-aware Box Filtering mechanism evaluates pseudo boxes using classification confidence, classification entropy, and localization entropy. In addition, a lightweight Sparse Dilated Mona module enables parameter-efficient delta tuning while limiting source-domain forgetting. ABDD is evaluated on CD-AeBD and HD-AeBD under multiple domain-shift scenarios, with TTA strategies compared under a unified RT-DETR + Swin-T architecture. Experiments show that ABDD consistently improves detection robustness under domain shifts, and its practicality is further validated on an industrial inspection platform.

cs.CV↗

arXiv2026

MAOL: Morphology-Aware Ordinal Learning for Fine-Grained Industrial Defect Severity Grading

Fine-grained defect severity grading is essential for industrial inspection, yet remains challenging due to the ordinal nature of severity labels, the strong dependence on morphology-related cues, and the train-test discrepancy between clean annotated instances and noisy predicted instances in two-stage pipelines. We propose MAOL, a Morphology-Aware Ordinal Learning framework for fine-grained industrial defect severity grading. MAOL formulates severity grading as an instance-level ordinal learning task, incorporates explicit morphological features to enhance representation learning, introduces class-conditional adaptive ordinal thresholds to model defect-specific grading boundaries, and employs prediction-aware training via localization perturbation to improve robustness to imperfect predicted instances. Extensive experiments under both clean-ROI and predicted-instance settings demonstrate that MAOL consistently outperforms rule-based methods, nominal classification models, and existing ordinal baselines, especially in the predicted-instance setting. The proposed approach ranked third in the IDA 2026 Challenge on Fine-Grained Severity Grading for High-Precision Manufacturing.

cs.CV↗

arXiv2026

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.

cs.CV↗