arXiv subjects

A. Murthy

Publications and source records attributed to A. Murthy.

4 recordsLinked to original sources

arXiv2026

Improving the performance of mid-T baked niobium cavities through post-bake surface treatment

The Medium temperature (mid-T) baking of niobium superconducting radio-frequency cavities at 300 350 C in a vacuum furnace is known to enhance the quality factor (Q₀). However, despite this improvement, cavities treated with this process often exhibit premature quench at relatively low accelerating fields. This limitation is suspected to arise from the formation of surface contaminants, such as niobium carbides, during the furnace bake at 350 C for 3 h. To investigate the influence of potential surface contamination, this study applied an ultralight chemical removal to 1.3 GHz and 650 MHz single-cell cavities that had undergone medium-temperature baking. The removal of the top RF surface layer led to a notable improvement in the quench field and Q₀, indicating a beneficial effect of eliminating possible surface residues introduced during the bake.

physics.acc-ph↗

arXiv2025

Performance Enhancement of Medium-Temperature Baked Niobium SRF Cavity by Surface Contamination Removal

Medium temperature (mid-T) baking, typically conducted at 300 350 C, enhances the quality factor of niobium (Nb) superconducting radio frequency cavities. High vacuum furnace baking is commonly preferred for its practicality in large-scale processing. However, surface contamination, such as niobium carbide formed during vacuum furnace baking, can limit the quench field and degrade the quality factor of the cavity. To investigate this effect, a 1.3 GHz single-cell Nb cavity underwent mid-T baking, followed by a chemical treatment to remove the surface contaminants. Post-treatment measurements revealed a significant improvement in both the quality factor and the quench field.

physics.acc-ph↗

arXiv2025

Optimizing Superconducting Nb Film Cavities by Mitigating Medium-Field Q-Slope Through Annealing

Niobium films are of interest in applications in various superconducting devices, such as superconducting radiofrequency cavities for particle accelerators and superconducting qubits for quantum computing. In this study, we addressed the persistent medium-field Q-slope issue in Nb film cavities, which, despite their high-quality factor at low RF fields, exhibit a significant Q-slope at medium RF fields compared to bulk Nb cavities. Traditional heat treatments, effective in reducing surface resistance and mitigating the Q-slope in bulk Nb cavities, are challenging for niobium-coated copper cavities. To overcome this challenge, we employed DC biased high-power impulse magnetron sputtering to deposit niobium film onto a 1.3 GHz single-cell elliptical bulk niobium cavity, followed by annealing treatments aimed at modifying the properties of the niobium film. In-situ annealing at 340 {\deg}C increased the quench field from 10.0 to 12.5 MV/m. Vacuum furnace annealing at 600 {\deg}C and 800 {\deg}C for 3 hours resulted in a quench field increase of 13.5 and 15.3 MV/m, respectively. Further annealing at 800 {\deg}C for 6 hours boosted the quench field to 17.5 MV/m. Additionally, the annealing treatments significantly reduced the field dependence of the surface resistance. However, increasing the annealing temperature to 900 {\deg}C induced a Q-switch phenomenon in the cavity. The analysis of RF performance and material characterization before and after annealing has provided critical insights into how the microstructure and impurity levels in Nb films influence the evolution of the Q-slope in Nb film cavities. Our findings highlight the significant roles of hydrides, high local misorientation, and lattice and surface defects in driving field-dependent losses.

physics.acc-ph↗

arXiv2024

Direct Measurement of Microwave Loss in Nb Films for Superconducting Qubits

Niobium films are a key component in modern two-dimensional superconducting qubits, yet their contribution to the total qubit decay rate is not fully understood. The presence of different layers of materials and interfaces makes it difficult to identify the dominant loss channels in present two-dimensional qubit designs. In this paper we present the first study which directly correlates measurements of RF losses in such films to material parameters by investigating a high-power impulse magnetron sputtered (HiPIMS) film atop a three-dimensional niobium superconducting radiofrequency (SRF) resonator. By using a 3D SRF structure, we are able to isolate the niobium film loss from other contributions. Our findings indicate that microwave dissipation in the HiPIMS-prepared niobium films, within the quantum regime, resembles that of record-high intrinsic quality factor of bulk niobium SRF cavities, with lifetimes extending into seconds. Microstructure and impurity level of the niobium film do not significantly affect the losses. These results set the scale of microwave losses in niobium films and show that niobium losses do not dominate the observed coherence times in present two-dimensional superconducting qubit designs, instead highlighting the dominant role of the dielectric oxide in limiting the performance. We can also set a bound for when niobium film losses will become a limitation for qubit lifetimes.

cond-mat.supr-con↗