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Quantum Imaging and Metrology

Hwang Lee·Pieter Kok·Jonathan P. Dowling
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Abstract

The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.

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Hwang Lee, Pieter Kok, Jonathan P. Dowling. 2003-06-17. Quantum Imaging and Metrology. https://arxiv.org/abs/quant-ph/0306113

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