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Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion

Ayman F. Abouraddy·Kimani C. Toussaint, Jr.·Alexander V. Sergienko·Bahaa E. A. Saleh·Malvin C. Teich
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Abstract

We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.

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Ayman F. Abouraddy, Kimani C. Toussaint, Jr., Alexander V. Sergienko, Bahaa E. A. Saleh, Malvin C. Teich. 2001-10-12. Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion. https://doi.org/10.1364/ol.26.001717

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