arXiv · physics/0608093
Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale
Abstract
Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and hysteresis-free translation in the 0.05-20 nm range. The voltage-activated motion is described by a coefficient of 0.03 \pm 0.005 nm/V.
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V. P. Tichinsky, A. V. Kretushev, P. N. Luskinovich. 2006-08-08. Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale. https://arxiv.org/abs/physics/0608093
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