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Effects of boundary roughness on a Q-factor of whispering-gallery-mode lasing microdisk cavities

A. I. Rahachou·I. V. Zozoulenko
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Abstract

We perform numerical studies of the effect of sidewall imperfections on the resonant state broadening of the optical microdisk cavities for lasing applications. We demonstrate that even small edge roughness causes a drastic degradation of high-Q whispering gallery (WG) mode resonances reducing their Q-values by many orders of magnitude. At the same time, low-Q WG resonances are rather insensitive to the surface roughness. The results of numerical simulation obtained using the scattering matrix technique, are analyzed and explained in terms of wave reflection at a curved dielectric interface combined with the examination of Poincare surface of sections in the classical ray picture.

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A. I. Rahachou, I. V. Zozoulenko. 2003-05-27. Effects of boundary roughness on a Q-factor of whispering-gallery-mode lasing microdisk cavities. https://doi.org/10.1063/1.1625781

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