Glass transitions and dynamics in thin polymer films: dielectric relaxation of thin films of polystyrene

Abstract

The glass transition temperature $T_{\rm g}$ and the temperature $T_α$ corresponding to the peak in the dielectric loss due to the $α$-process have been simultaneously determined as functions of film thickness d through dielectric measurements for polystyrene thin films supported on glass substrate. The dielectric loss peaks have also been investigated as functions of frequency for a given temperature. A decrease in $T_{\rm g}$ was observed with decreasing film thickness, while $T_α$ was found to remain almost constant for $d>d_{\rm c}$ and to decrease drastically with decreasing d for $d<d_{\rm c}$. Here, $d_{\rm c}$ is a critical thickness dependent on molecular weight. The relaxation time of the $α$-process was found to have a d dependence similar to that of $T_α$. The relaxation function for the $α$-process was obtained by using the observed frequency dependence of the peak profile of the dielectric loss. The exponent $β_{\tiny KWW}$, which was obtained from the relaxation functions, decreases as thickness decreases. This suggests that the distribution of relaxation times for the $α$-process broadens with decreasing thickness. The thickness dependence of $T_{\rm g}$ is directly related to the distribution of relaxation times for the $α$-process, not to the relaxation time itself.