Discrimination and analysis of interactions in non-contact Scanning Force Microscopy

Abstract

A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement of cantilever deflection, oscillation amplitude and frequency shift as a function of tip-sample voltage and tip-sample distance as well as on advanced data processing. Data is acquired at a fixed lateral position as interaction images with the bias voltage as fast scan and tip-sample distance as slow scan. Due to the quadratic dependence of the electrostatic interaction with tip-sample voltage the Van der Waals force can be separated from the electrostatic force. Using appropriate data-processing the Van der Waals interaction, the capacitance as well as the contact potential can be determined as a function of tip-sample distance from the force as well as from the frequency shift data. The measurement of resonance frequency shift yields very high signal to noise ratio and the absolute calibration of the measured quantities, while the acquisition of cantilever deflection allows the determination of tip-sample distance. The separation and quantitative analysis of Van der Waals and electrostatic interaction as proposed in the present work results in precise and reproducible measurement of tip-sample interaction that will significantly improve the interpretation of SFM data and will substantially contribute to the characterization of nanoscale properties by SFM.