arXiv ScienceSearch

arXiv · cond-mat/0403276

Far-field optical microscope with nanometer-scale resolution

Abstract

The resolution of far-field optical microscopes, which rely on propagating optical modes, is widely believed to be limited because of diffraction to a value on the order of a half-wavelength $λ/2$ of the light used. Although immersion microscopes have slightly improved resolution on the order of $λ/2n$, the increased resolution is limited by the small range of refractive indices n of available transparent materials. Here we demonstrate a new far-field optical microscope design, which is capable of reaching nanometer-scale resolution. This microscope uses the fact that the effective refractive index $n_{eff}$ of a planar dielectric lens or mirror placed on a metal surface may reach extremely large values, up to $10^3$, as seen by propagating surface optical modes (plasmons). In our design a magnified planar image produced originally by surface plasmons in the metal plane is viewed by a regular microscope. Thus, the theoretical diffraction limit on resolution is pushed down to nanometer-scale $λ/2n_{eff}$ values. Used in reverse, such a microscope may become an optical lithography tool with nanometer-scale spatial resolution.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Igor I. Smolyaninov, Christopher C. Davis, Jill Elliott, Anatoly V. Zayats. 2004-03-10. Far-field optical microscope with nanometer-scale resolution. https://doi.org/10.1103/physrevlett.94.057401

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Competing effects of Si and Mg doping on native point defects in yttrium aluminum garnet

We investigate how Si and Mg doping affect native point defects in yttrium aluminum garnet (YAG) by combining first-principles calculations with a thermodynamic model of defect equilibria. Formation energies and equilibrium concentrations of native defects, dopants, and defect complexes are obtained across the full range of oxygen chemical potentials relevant to ceramic sintering. Donor (Si) and acceptor (Mg) dopants are found to control native defect populations efficiently but in opposite directions: Si substantially raises cation-vacancy concentrations while suppressing oxygen vacancies, whereas Mg produces the reverse trend. Depending on dopant concentration and oxygen chemical potential, native vacancy concentrations vary by up to thirteen orders of magnitude. The concentration of isolated cation vacancies depends nonmonotonically on Si content, a consequence of Si-vacancy complex formation. Under Si-Mg co-doping, the two dopants compensate each other efficiently, giving rise to pronounced minima in both cation- and oxygen-vacancy concentrations when Si and Mg are present in equal amounts. These findings provide a microscopic basis for the pronounced sensitivity of YAG sintering behavior to the Si/Mg ratio, and show that balanced donor-acceptor co-doping is an effective strategy for controlling native defect populations in YAG.

cond-mat.mtrl-sci

Depth-resolved magnetization dynamics in Fe thin films after ultrafast laser excitation

We performed time-resolved x-ray resonant magnetic reflectivity measurements on a laser-excited ferromagnetic Fe thin film to simultaneously probe the transient magnetic and structural depth profiles with nanometer spatial and femtosecond temporal resolution. Our results show that during the first picoseconds after optical excitation, the magnetization of the Fe layer is strongly inhomogeneous, especially in the vicinity of the buried interface. By comparing our experimental results to predictions based on the microscopic three-temperature model and simulations of laser-induced spin-currents, we demonstrate that local and non-local angular momentum transfer phenomena take place simultaneously. After a few picoseconds, the magnetization relaxes back to equilibrium while the total thin film thickness starts oscillating periodically, with a maximum dilation of approximately 1.3% of the entire thin film thickness due to laser-induced stresses.

cond-mat.mtrl-sci

Statistical admissibility and long-wavelength structural convergence determine representative support in granular materials

Representative elementary areas and volumes provide the scale bridge between resolved granular microstructure and continuum-scale material properties, yet they are still commonly selected from the apparent stabilization of a single scalar observable. Such plateaus can be false indicators of representativeness when statistically incompatible regions are averaged together or when long-wavelength structural correlations remain unresolved. We introduce a general representative-support framework for granular materials based on three sequential requirements: statistical admissibility of the sampled domain, persistent convergence of the apparent field mean and the low-wavenumber covariance spectrum, and validation against independent effective properties. The concept is tested on seven large-area backscattered-electron images of Arabian dune sands and mineral-resolved QEMSCAN maps. The structure-only criterion identifies a representative elementary area of $1536$ pixels, corresponding to approximately $2.01~\mathrm{mm}$. Without property-specific fitting or recalibration, the same physical scale transferred to the QEMSCAN grid $(\approx 2.04~\mathrm{mm})$ coincides with the onset of weak size dependence in apparent thermal conductivity, elastic stiffness, and directional Young's moduli. Thus, the representative scale inferred from long-wavelength granular organization independently predicts the convergence of distinct constitutive responses. The results show that representative support should be assigned only after both statistical compatibility and long-range structural convergence have been established. Although demonstrated here on two-dimensional dune-sand sections, the criterion is formulated for granular materials generally and has a direct mathematical extension to three-dimensional voxelized volumes.

cond-mat.mtrl-sci