A reduced-order analysis for multi-reflection-driven laser absorptance in vaporization-induced cavities

Abstract

Multiple internal reflections enhance laser absorption in vaporization-induced cavities, but connecting ray histories, cavity geometry, and absorptance typically requires full ray tracing. We develop a reduced-order framework based on Beer-Lambert-type attenuation governed by an effective per-reflection optical depth (EPROD). A power-weighted formulation defines an absorptance-equivalent interaction count under constant effective single-interaction absorptance, while a cumulant expansion separates the EPROD-independent mean interaction count from ray-path heterogeneity corrections. Across nine simulation groups spanning three alloys and three spot diameters, the mean interaction count follows a unit-intercept linear depth relation with R-squared values of 0.7824-0.9843. Its slope varies by only 3.4%-6.3% across alloys at fixed spot diameter and decreases with increasing spot diameter. Fixing this slope from ray statistics yields an absorptance-depth model with one fitted parameter and a median prediction error (MAPE) of 2.61%. An independent synchronized Ti-64 experiment yields model parameters within approximately 2.4% of corresponding simulation values. This framework separates geometric interaction accumulation from optical attenuation, enabling efficient energy-coupling prediction and absorptance-based keyhole characterization.