Design of a Fast Crowbar Protection Circuit for Single Event Effect Testing

Collin Burt; Joseph D'Amico; Joseph Van Grinsven; Tommy Aldaz; Nathaniel Dodds

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arXiv · 2608.27772

Design of a Fast Crowbar Protection Circuit for Single Event Effect Testing

Collin Burt·Joseph D'Amico·Joseph Van Grinsven·Tommy Aldaz·Nathaniel Dodds

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Abstract

We describe the design of a custom crowbar circuit that quickly removes power when a programmable current threshold is exceeded. This protects devices from permanent damage during single event latchup/burnout tests.

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Collin Burt, Joseph D'Amico, Joseph Van Grinsven, Tommy Aldaz, Nathaniel Dodds. 2026-08-27. Design of a Fast Crowbar Protection Circuit for Single Event Effect Testing. https://arxiv.org/abs/2608.27772

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